Simultaneous Measurement of Electric and Magnetic Fields With a Dual Probe for Efficient Near-Field Scanning

Shao, Weiheng; Fang, Wenxiao; Huang, Yun; Li, Guangwei; Wang, Lei; He, Zhiyuan; Shao, E; Guo, Yuandong; En, Yunfei; Ye, Bin

doi:10.1109/tap.2019.2897476

Cited by 59 publications

(28 citation statements)

References 17 publications

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“…The frequency response of the proposed probe is defined as

S

_{21}

, then the calibration factor

CF

can be evaluated in dB as follows [6, 13].

\begin{matrix} true \\ right CF & left = \frac{H}{boldU_{2}} \\ left = 20 \log_{10} ([], \frac{h}{π d (d + 2 h)}) - | S_{21} | - 34 [dB \cdot (A / m) / V] . \end{matrix}

…”

Section: Characteristics Of the Proposed Probementioning

confidence: 99%

“…The frequency response of the proposed probe is defined as S 21 , then the calibration factor CF can be evaluated in dB as follows [6,13].…”

Section: Frequency Response and Calibration Factormentioning

confidence: 99%

“…The following EMC problems include three aspects: (1) immunity ability decreases due to the smaller supply voltage of microcontroller; (2) the high power density of power electronic device brings the improvement of the emission intensity of the interference source; (3) the interference coupling efficiency increases due to the increase of working frequency and the decrease of dimension spacing. In order to analyze and solve these prob-lems, near-field probes for a variety of processes and detection structures are proposed [3][4][5][6][7][8][9][10]. These probes are usually used to analyze electromagnetic interference (EMI) [11], assess electromagnetic emission level [12,13], locate EMI sources [14,15], reconstruct EMI source [16,17], locate the faults of IGBT [18], implement over-the-air test of dipole and patch antenna arrays [19], detect and analyze of fake large scale integration (LSI) circuits and their abnormal behavior [20].…”

Section: Introductionmentioning

confidence: 99%

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A two‐turn loop active magnetic field probe design for high sensitivity near‐field measurement

Shao

Huang

et al. 2021

IET Science Measure & Tech

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This paper develops an active magnetic near field probe (H-field probe) by using a fourlayer printed circuit board (PCB) technique. Two-turn detection structure and a low noise amplifier are used to improve probe's frequency response. The two-turn detection structure can maximize the use of PCB stack resources, and a 14.5 dB gain amplifier can increase signal output capability. The probe can then be used for electromagnetic compatibility (EMC) test from 150 kHz to 3 GHz. Compared with traditional active shielded-loop H-field probe (TAHP) with loop area of 500 𝜇m 2 , the frequency response of the proposed probe can improve 20 dB at 0.5 GHz. Different from the method of comparing the sensitivity of the probe only through the frequency response, this paper measures and analyzes the real sensitivity of the probing device composed of the proposed probe. Under the condition of the same receiver parameter setting, the sensitivity at 0.5 GHz is increased by 11.7 dB compared with commercial passive probing device and 20.2 dB at 0.5 GHz compared with the probing device with TAHP device. It reaches −32.4 dB µA. In addition, the proposed probe has acceptable spatial resolution of 1.28 mm at 1 GHz, which is more suitable for printed circuit board level EMI analysis.

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“…The frequency response of the proposed probe is defined as

S

_{21}

, then the calibration factor

CF

can be evaluated in dB as follows [6, 13].

\begin{matrix} true \\ right CF & left = \frac{H}{boldU_{2}} \\ left = 20 \log_{10} ([], \frac{h}{π d (d + 2 h)}) - | S_{21} | - 34 [dB \cdot (A / m) / V] . \end{matrix}

…”

Section: Characteristics Of the Proposed Probementioning

confidence: 99%

“…The frequency response of the proposed probe is defined as S 21 , then the calibration factor CF can be evaluated in dB as follows [6,13].…”

Section: Frequency Response and Calibration Factormentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

A two‐turn loop active magnetic field probe design for high sensitivity near‐field measurement

Shao

Huang

et al. 2021

IET Science Measure & Tech

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“…Such an air-substrate microstrip line is not easy to fabricate. Nevertheless, a RO4350B-substrate microstrip for probe characterisation at low frequencies is acceptable [4,5,19,20,[24][25][26]. The magnetic field above the microstrip line can be calculated by [4,5,24].…”

Section: Frequency Response and Calibration Factormentioning

confidence: 99%

“…The frequency response of the proposed probe is defined as S d = S 23 − S 13 , then the calibration factor CF can be evaluated in dB as follow [5,20]. Figure 5 shows the frequency response of the probe and the calibration factor with the parameters d = 1.7 mm, θ = 0°.…”

Section: Frequency Response and Calibration Factormentioning

confidence: 99%

Symmetrical double‐loop H‐field probe with floating shield for improving sensitivity and electric field suppression

Liu

Xiao

et al. 2021

IET Microwaves Antenna & Prop

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A magnetic near-field probe (H-field probe) with dual output has been developed using a four-layer printed circuit board (PCB) technique. To achieve the improvement of detection sensitivity, the symmetrical double-loop is adopted to double the detection signal while suppressing the electric field coupling, which is also illustrated in a circuit model. The calibration factor (defined as the ratio of the external magnetic field to the induced response voltage of the probe) of the proposed H-field probe reaches 37.74 [dB (A/m)/V] at 0.5 GHz with the loop area of 0.8 mm 2 , resulting in a better sensitivity than the single-loop probe. For the suppression of unwanted electric field a floating shield is added to the bottom of the probe, leading to an excellent common electric field suppression ratio of 29 dB in the frequency range up to 10 GHz. The probe is also characterised by parameters such as high differential electric field suppression, spatial resolution and probe influence on the device under test. This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.

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De‐embedding calibration for an electromagnetic dual probe using GCPW

Li,

Shao,

Tian

et al. 2023

Micro & Optical Tech Letters

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An ultrawideband de‐embedding calibration method (DCM) for a dual probe is proposed in this paper. Different from the conventional calibration method (CCM), in which a microstrip calibrator and the dual probe form a three‐port calibration network, the proposed calibration system is a four‐port network. By using two different lengths of grounded coplanar waveguide (GCPW) calibrators, namely line‐kit and through‐kit, the de‐embedded ‐parameter model of the calibration network is obtained. Measured results show that the ripple of the DCM with GCPW reduced by 59% of the CCM with the microstrip calibrator, and the phase delay has been almost compensated. In addition, the proposed method reduces the attenuation by approximately 0.7 dB at 10 GHz and 1.15 dB at 20 GHz. The calibration results indicate that the working frequency of the DCM is up to 22 GHz.

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Simultaneous Measurement of Electric and Magnetic Fields With a Dual Probe for Efficient Near-Field Scanning

Cited by 59 publications

References 17 publications

A two‐turn loop active magnetic field probe design for high sensitivity near‐field measurement

A two‐turn loop active magnetic field probe design for high sensitivity near‐field measurement

Symmetrical double‐loop H‐field probe with floating shield for improving sensitivity and electric field suppression

De‐embedding calibration for an electromagnetic dual probe using GCPW

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