2015
DOI: 10.1063/1.4923411
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Simultaneous fabrication of nanogap electrodes using field-emission-induced electromigration

Abstract: Controlling the tunnel resistance of suspended Ni nanogaps using field-emission-induced electromigration J. Vac. Sci. Technol. B 33, 02B107 (2015); 10.1116/1.4904731Fabrication of planar-type Ni/vacuum/Ni tunnel junctions based on ferromagnetic nanogaps using field-emissioninduced electromigrationWe present a simple technique for simultaneous control of the electrical properties of multiple Ni nanogaps. This technique is based on electromigration induced by a field emission current and is called "activation." … Show more

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Cited by 9 publications
(1 citation statement)
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“…22) In a previous study, we developed a simple technique for the fabrication of nanogaps with well-controlled tunnel resistance called "activation." [23][24][25][26][27][28][29][30] This method is based on electromigration (EM) induced by a Fowler-Nordheim (F-N) field emission current. The activation scheme controls the tunnel resistance of the nanogaps by adjusting the magnitude of the field emission current.…”
Section: Introductionmentioning
confidence: 99%
“…22) In a previous study, we developed a simple technique for the fabrication of nanogaps with well-controlled tunnel resistance called "activation." [23][24][25][26][27][28][29][30] This method is based on electromigration (EM) induced by a Fowler-Nordheim (F-N) field emission current. The activation scheme controls the tunnel resistance of the nanogaps by adjusting the magnitude of the field emission current.…”
Section: Introductionmentioning
confidence: 99%