Abstract:The Borrmann effect (the anomalous transmission of x rays through thick perfect crystals) has been used as the primary diffraction in a study of simultaneous diffraction. The major part of the work is an analysis of multiple diffraction using the dynamical theory of x-ray diffraction. In the analysis we have utilized the concept of normal modes in describing the propagation of the x-ray wave field. We have determined these modes when the Bragg condition is exactly and simultaneously satisfied for all the diffr… Show more
“…In recent years numerous treatments of multibeam cases have appeared in the literature* (Saccocio & Zajac, 1965;Hildebrandt, 1967;Joko & Fukuhara, 1967;Ewald & H6no, 1968;H6no & Ewald, 1968;Penning, 1968;Penning & Polder, 1968;Dalisa, Zajac & Ng, 1968;Balter, Feldman & Post, 1971, and many others). In all these papers only the Laue case of diffraction was considered, because the authors' attention was concentrated on the enhancement of anomalous transmission occurring in some multi-beam cases (double Borrmann effect).…”
“…In recent years numerous treatments of multibeam cases have appeared in the literature* (Saccocio & Zajac, 1965;Hildebrandt, 1967;Joko & Fukuhara, 1967;Ewald & H6no, 1968;H6no & Ewald, 1968;Penning, 1968;Penning & Polder, 1968;Dalisa, Zajac & Ng, 1968;Balter, Feldman & Post, 1971, and many others). In all these papers only the Laue case of diffraction was considered, because the authors' attention was concentrated on the enhancement of anomalous transmission occurring in some multi-beam cases (double Borrmann effect).…”
“…In both cases, the beam is translated from its initial position due to these multiple scattering events. This effect, termed the Borrmann effect 40 , makes the TXM line beam spread out laterally, as ghost-fringes appear next to the primary beam. Information about the extent of dynamical diffraction can be helpful in understanding how to interpret image features with DFXM, as they also complicate signal in DFXM images.…”
The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, dark field X-ray microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $$10^{12}$$
10
12
photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.
“…After the famous experimental work of Borrmann & Hartwig (1965), the dynamical theory, which has no restrictions on the numbe? of excited reflections, has usually been applied to multiple diffraction so that the situations in which more than one set of atomic planes are in position to transmit X-rays anomalously could be investigated (Saccocio & Zajac, 1965;Hildebrand, 1967;Joko & Fukuhara, 1967;Penning, 1968;Iveronova, Katsnelson & Runova, 1977;Post, Chang & Huang, 1977). In the paper of Ewaid & H6no (1968), there is also discussed the problem of direct Umweganregung phenomena.…”
The positive diffraction intensity changes on forbidden (222) planes of a vibrating single crystal of Si, which are produced by simultaneous diffraction, are experimentally treated for the symmetric Laue case. The neutron diffraction experiment was performed for a flexurally vibrating as well as a non-vibrating perfect silicon bar. Several Umweganregung peaks were observed after exciting the bar into vibration while no Umweganregung peak was observed in the case of a non-vibrating crystal.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.