2012
DOI: 10.1017/s1431927612006265
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Simultaneous Atomic Force and Confocal Fluorescence Microscopy for Correlated Nanometer Topographical and Optical Resolution

Abstract: Progress in nanosciences and life sciences is closely related to developments of high resolution imaging techniques. During the last decades the invention and improvement of scanning probe microscopy techniques like atomic force microscopy (AFM) [1] have opened new views onto nanoscale materials. On the other side, optical microscopy has been pushed beyond the diffraction limit and the observation of single molecules has evolved into a standard technology [2]. We have performed experiments with a combined AFM/… Show more

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