Simultaneous 8.2 keV phase-contrast imaging and 24.6 keV X-ray diffraction from shock-compressed matter at the LCLS

Seiboth, Frank; Fletcher, L. B.; McGonegle, David; Anzellini, Simone; Dresselhaus-Cooper, Leora; Frost, Mungo; Galtier, E.; Goede, Sebastian; Harmand, M.; Lee, H. J.; Levitan, Abraham; Miyanishi, Kohei; Nagler, Bob; Nam, Inhyuk; Ozaki, Norimasa; Rödel, Melanie; Schropp, Andreas; Spindloe, C.; Sun, Peihao; Wark, J. S.; Hastings, J. B.; Glenzer, S. H.; McBride, E. E.

doi:10.1063/1.5031907

Cited by 26 publications

(13 citation statements)

References 20 publications

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“…Time-resolved diffraction offers a direct means to determine the quantitative structural information through the atomic pair correlation function (PCF) ( 12 , 18 ), the construction of which, however, requires the measurement of diffraction data over a large momentum transfer range. For diffraction measurements with field-accelerated electrons, this can be readily met because of their short de Broglie wavelengths (0.34 pm for 3.2-MeV electrons), whereas for measurements with XFELs, it requires high-energy x-rays (50 pm for 25-keV x-rays) that have recently become available for experiments ( 19 ).…”

Section: Introductionmentioning

confidence: 99%

Visualization of ultrafast melting initiated from radiation-driven defects in solids

Murphy

Chen

et al. 2019

Sci. Adv.

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Materials exposed to extreme radiation environments such as fusion reactors or deep spaces accumulate substantial defect populations that alter their properties and subsequently the melting behavior. The quantitative characterization requires visualization with femtosecond temporal resolution on the atomic-scale length through measurements of the pair correlation function. Here, we demonstrate experimentally that electron diffraction at relativistic energies opens a new approach for studies of melting kinetics. Our measurements in radiation-damaged tungsten show that the tungsten target subjected to 10 displacements per atom of damage undergoes a melting transition below the melting temperature. Two-temperature molecular dynamics simulations reveal the crucial role of defect clusters, particularly nanovoids, in driving the ultrafast melting process observed on the time scale of less than 10 ps. These results provide new atomic-level insights into the ultrafast melting processes of materials in extreme environments.

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Section: Introductionmentioning

confidence: 99%

Visualization of ultrafast melting initiated from radiation-driven defects in solids

Murphy

Chen

et al. 2019

Sci. Adv.

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“…In experiments, strain fields can be obtained via DIC with X-ray phase contrast imaging or optical imaging, and along with simultaneous X-ray diffraction, full strain tensors can be obtained for the most common loading modes. Both imaging and diffraction can be carried out at the single-bunch level at synchrotrons or XFELs (Luo et al, 2012;Lu et al, 2016;Seiboth et al, 2018). Thus, Method IV can be implemented for in situ, real-time, dynamic synchrotron or XFEL experiments.…”

Section: Loading Modesmentioning

confidence: 99%

“…However, it is still a challenge to measure the full bulk strain tensor, especially for fast or ultrafast dynamic experiments. The development of advanced X-ray sources such as synchrotron radiation sources and X-ray free-electron lasers (XFELs) offers the opportunity to capture in situ dynamic events (Luo et al, 2012;Milathianaki et al, 2013;Wehrenberg et al, 2017;Seiboth et al, 2018;Coleman et al, 2019;Brown et al, 2019;Huang et al, 2016a,b;Fan et al, 2016;Turneaure et al, 2017;Briggs et al, 2019), including strain and X-ray diffraction measurements.…”

Section: Introductionmentioning

confidence: 99%

Full strain tensor measurements with X-ray diffraction and strain field mapping: a simulation study

Tang

Huang

Zhang

et al. 2020

J Synchrotron Radiat

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Strain tensor measurements are important for understanding elastic and plastic deformation, but full bulk strain tensor measurement techniques are still lacking, in particular for dynamic loading. Here, such a methodology is reported, combining imaging-based strain field mapping and simultaneous X-ray diffraction for four typical loading modes: one-dimensional strain/stress compression/tension. Strain field mapping resolves two in-plane principal strains, and X-ray diffraction analysis yields volumetric strain, and thus the out-of-plane principal strain. This methodology is validated against direct molecular dynamics simulations on nanocrystalline tantalum. This methodology can be implemented with simultaneous X-ray diffraction and digital image correlation in synchrotron radiation or free-electron laser experiments.

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“…Spatial resolution down to below 30 nm has been demonstrated (Bartels et al, 2015;Khimchenko et al, 2018). Several studies have already demonstrated projection and propagation imaging at XFELs (Rosenhahn et al, 2009;Schropp et al, 2012Schropp et al, , 2015Seiboth et al, 2018;Vagovič et al, 2019), but the intrinsic fluctuations of self-amplified spontaneous emission (SASE) illumination and the detrimental consequences for phase retrieval have not yet been solved. Previous methods presented for data treatment (Vagovič et al, 2019) are not suited for the case of highmagnification imaging since these can induce a loss of small features in the data.…”

Section: Introductionmentioning

confidence: 99%

Single-pulse phase-contrast imaging at free-electron lasers in the hard X-ray regime

Hagemann¹,

Vassholz²,

Hoeppe³

et al. 2021

J Synchrotron Radiat

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X-ray free-electron lasers (XFELs) have opened up unprecedented opportunities for time-resolved nano-scale imaging with X-rays. Near-field propagation-based imaging, and in particular near-field holography (NFH) in its high-resolution implementation in cone-beam geometry, can offer full-field views of a specimen's dynamics captured by single XFEL pulses. To exploit this capability, for example in optical-pump/X-ray-probe imaging schemes, the stochastic nature of the self-amplified spontaneous emission pulses, i.e. the dynamics of the beam itself, presents a major challenge. In this work, a concept is presented to address the fluctuating illumination wavefronts by sampling the configuration space of SASE pulses before an actual recording, followed by a principal component analysis. This scheme is implemented at the MID (Materials Imaging and Dynamics) instrument of the European XFEL and time-resolved NFH is performed using aberration-corrected nano-focusing compound refractive lenses. Specifically, the dynamics of a micro-fluidic water-jet, which is commonly used as sample delivery system at XFELs, is imaged. The jet exhibits rich dynamics of droplet formation in the break-up regime. Moreover, pump–probe imaging is demonstrated using an infrared pulsed laser to induce cavitation and explosion of the jet.

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Simultaneous 8.2 keV phase-contrast imaging and 24.6 keV X-ray diffraction from shock-compressed matter at the LCLS

Abstract: Setup for meV-resolution inelastic X-ray scattering measurements and X-ray diffraction at the Matter in Extreme Conditions endstation at the Linac Coherent Light Source Review of Scientific Instruments 89, 10F104 (2018);

Cited by 26 publications

References 20 publications

Visualization of ultrafast melting initiated from radiation-driven defects in solids

Visualization of ultrafast melting initiated from radiation-driven defects in solids

Full strain tensor measurements with X-ray diffraction and strain field mapping: a simulation study

Single-pulse phase-contrast imaging at free-electron lasers in the hard X-ray regime

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