Abstract:Terrestrial single-event transients (SETs) are mainly induced by secondary ions of neutron-induced nuclear reactions, which do not cross the sensitive drain in most cases. Technology computer-aided design (TCAD) simulations show that in those cases, both diffusion-collection current and burst-plateau-type current waveform could occur in nanoscale complementary metal-oxide-semiconductor (CMOS) technology. The necessity of including recombination effect in diffusion-collection model is identified, and an equival… Show more
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