Simulation of X-ray topographs

Epelboin, Y.

doi:10.1016/0025-5416(85)90294-0

Cited by 89 publications

(40 citation statements)

References 69 publications

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“…hence allows the estimation of the modulus of b, which for X-rays is usually carried out by analysis of section topographs (Epelboin, 1985).…”

Section: Figurementioning

confidence: 99%

“…The experimental images have been compared with simulated ones. A complete description of the program and the method used to simulate straight dislocations in X-ray topographs can be found in a review paper by Epelboin (1985). In particular, the contrast variations and width of dislocation images for different working points on the Ge rocking curve were studied• Figs.…”

Section: Dislocation Images Recorded Near To the Peak Of The Rocking mentioning

confidence: 99%

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New Features of Dislocation Images in Third-Generation Synchrotron Radiation Topographs

Zontone¹,

Mancini²,

Barrett³

et al. 1996

J Synchrotron Rad

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Some aspects of the dislocation contrast observed at third-generation synchrotron radiation set-ups are presented. They can be explained by taking into account angular deviation effects on the beam propagation, which are visible because of the 'almost plane-wave' character of these sources. In particular, we show how the evolution of the direct image width of a dislocation as a function of the sample-to-film distance can allow a complete determination of the Burgers vector, i.e. in sign and modulus. In addition, experimental results obtained in monochromatic beam topography are compared with simulated images calculated assuming plane-wave illumination and are demonstrated to show a satisfactory agreement. The utility of the weak-beam technique in enhancing the spatial resolution is demonstrated and a criterion for the selection of experimental conditions depending upon the required spatial resolution, signal-to-noise ratio and exposure time is presented.

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“…hence allows the estimation of the modulus of b, which for X-rays is usually carried out by analysis of section topographs (Epelboin, 1985).…”

Section: Figurementioning

confidence: 99%

Section: Dislocation Images Recorded Near To the Peak Of The Rocking mentioning

confidence: 99%

New Features of Dislocation Images in Third-Generation Synchrotron Radiation Topographs

Zontone¹,

Mancini²,

Barrett³

et al. 1996

J Synchrotron Rad

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“…In the dynamical theory of diffraction the orientation contrast has not yet been treated. Simulations of reflection topographs using Takagi-Taupin equations were made for the incident plane wave only (Epelboin, 1985).…”

Section: Discussi~nmentioning

confidence: 99%

Strain field due to a slip band near a grain boundary in an Fe-6at.% Si bicrystal. III. Simulation of the orientation contrast

Polcarová¹,

Gemperlová²,

Brádler³

1991

J Appl Cryst

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“…[79][80][81]. Since then, numerical implementations [93][94][95][96] have been developed to study x-ray diffraction of e.g. dislocations and other real-structure effects in crystals.…”

Section: Takagi and Taupinmentioning

confidence: 99%

Wave optical simulations of x-ray nano-focusing optics

Osterhoff¹

2012

Göttingen Series in X-Ray Physics

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Simulation of X-ray topographs

Cited by 89 publications

References 69 publications

New Features of Dislocation Images in Third-Generation Synchrotron Radiation Topographs

New Features of Dislocation Images in Third-Generation Synchrotron Radiation Topographs

Strain field due to a slip band near a grain boundary in an Fe-6at.% Si bicrystal. III. Simulation of the orientation contrast

Wave optical simulations of x-ray nano-focusing optics

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