Simulation of water ingress into PV-modules: IEC-testing versus outdoor exposure

Hülsmann, Philip; Weiß, Karl-Anders

doi:10.1016/j.solener.2015.03.007

Cited by 48 publications

(21 citation statements)

References 15 publications

(17 reference statements)

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“…Jankovec et al 56 measured water permeation in various PV encapsulant materials at 50° C and found saturation concentrations 20–30 times higher in EVA compared to polyolefin materials. In the 85° C/85% DH test, water reaches an equilibrium concentration of ∼2–5 kg/m 3 across the entire front of the cell after approximately 3000 h for EVA 10,57 . For POE we can expect the equilibrium concentration of water attained in the DH test to be substantially lower.…”

Section: Resultsmentioning

confidence: 96%

“…However, because of the distance required for water to travel to reach the front of the cell, cell‐front water concentrations take longest to equilibrate, up to 3000 h in DH. For EVA, it has been shown that cell‐front moisture concentrations achieved in 1000 h DH seem to be roughly equal to the final concentrations achieved after several years in the field 57 . EVA degrades with temperature and water via the hydrolysis of vinyl‐acetate monomers, resulting in acetic acid and vinyl alcohol, and is an autocatalytic reaction 58 .…”

Section: Resultsmentioning

confidence: 99%

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Degradation of copper‐plated silicon solar cells with damp heat stress

Karas

Michaelson²,

Munoz³

et al. 2020

Progress in Photovoltaics

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Crystalline silicon solar cells with copper-plated contacts are fabricated, encapsulated in ethylene-vinyl acetate (EVA), and subject to extended damp heat stress (85 C and 85% relative humidity). We source cell precursors from several different cell manufacturers and employ several different patterning methods of the silicon nitride layer and deposit a plated front contact stack of nickel, copper, and tin using light-induced plating. Across different Cu-plated samples, we find similar degradation that impacts

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Section: Resultsmentioning

confidence: 96%

Section: Resultsmentioning

confidence: 99%

Degradation of copper‐plated silicon solar cells with damp heat stress

Karas

Michaelson²,

Munoz³

et al. 2020

Progress in Photovoltaics

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show abstract

“…However, it has been shown by finite elements analysis that, for a sufficient duration of the DH stress test (3,000 h), 37,38) the water content (0.24-0.28% w=w) in the front EVA located in the central region of PV cell is estimated to be similar to that in its peripheral region. 38,39) The amount of water arriving in the front central encapsulant layer would be lower than that obtained by the simulation, since at least ca. 25-40% of water penetrating into the front peripheral region of the encapsulant has been already consumed in the hydrolysis of EVA within this peripheral region.…”

Section: Discussionmentioning

confidence: 99%

Acceleration of degradation by highly accelerated stress test and air-included highly accelerated stress test in crystalline silicon photovoltaic modules

Suzuki¹,

Tanahashi

Doi

et al. 2016

Jpn. J. Appl. Phys.

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We examined the effects of hyper-hygrothermal stresses with or without air on the degradation of crystalline silicon (c-Si) photovoltaic (PV) modules, to shorten the required duration of a conventional hygrothermal-stress test [i.e., the "damp heat (DH) stress test", which is conducted at 85°C/85% relative humidity for 1,000 h]. Interestingly, the encapsulant within a PV module becomes discolored under the air-included hygrothermal conditions achieved using DH stress test equipment and an air-included highly accelerated stress test (air-HAST) apparatus, but not under the air-excluded hygrothermal conditions realized using a highly accelerated stress test (HAST) machine. In contrast, the reduction in the output power of the PV module is accelerated irrespective of air inclusion in hyper-hygrothermal test atmosphere. From these findings, we conclude that the required duration of the DH stress test will at least be significantly shortened using air-HAST, but not HAST.

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“…In contrast, double glass modules remain relatively constant under the same level of exposures. 13 3(a), under 3000 hours of damp heat exposure, a signicant reduction up to 7.34% in power output is observed in traditional backsheet modules, while double glass module samples perform well within the IEC specication, which is less than 5% power degradation.…”

Section: Damp Heatmentioning

confidence: 99%

“…6(a). Aer the long-term multiple stress sequential, with the presence of water moisture, the acetate moiety of the EVA polymer reacts and forms acetic acid, [12][13][14] which can cause badly corrosion of electrical interconnects such as silver ngers and collector ribbons 15 as showed in Fig. 6(b) and (c), the great P max degradation of traditional modules results from the big loss in FF due to high R s , and this is because water vapor ingressing into traditional modules causes interconnects corrosion aer long-term multiple stress.…”

Section: Long-term Multiple Stress Sequentialmentioning

confidence: 99%

Long-term reliability of silicon wafer-based traditional backsheet modules and double glass modules

Zhang

Xu²,

Mao³

et al. 2015

RSC Adv.

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An extensive program of series extended sequential long-term reliability stress including thermal cycling (TC) 600, damp heat (DH) 3000, 600 hours potential induced degradation (PID) and humidity freeze (HF) 50 were performed on silicon wafer-based traditional backsheet modules and double glass photovoltaic (PV) modules. The relative module maximum power (P max ) degradations of traditional backsheet modules are 3.87%, 7.34%, 13.3%, 33.73% and those of double glass modules are 2.78%, 3.12%, 2.27%, 2.72%, respectively. From all the above results, HF50 has a greater impact on P max degradation of traditional backsheet modules, and a strong correlation is thereby found between the Water Vapor Transmission Rate (WVTR) of the backsheet and the P max degradation. Traditional backsheet modules have higher WVTR and greater P max degradation, while double glass modules are impermeable and have much lower P max degradation. The key factor for excellent performance of Si wafer-based double glass PV modules is replacing the polymer backsheet by a glass panel with impermeability to water vapor, which enables double glass modules to offer much higher reliability and longer durability.

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Simulation of water ingress into PV-modules: IEC-testing versus outdoor exposure

Cited by 48 publications

References 15 publications

Degradation of copper‐plated silicon solar cells with damp heat stress

Degradation of copper‐plated silicon solar cells with damp heat stress

Acceleration of degradation by highly accelerated stress test and air-included highly accelerated stress test in crystalline silicon photovoltaic modules

Long-term reliability of silicon wafer-based traditional backsheet modules and double glass modules

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