Simulation of reflectivity spectrum for non-absorbing multilayer optical thin films

Abstract

Reflectivity simulation is an essential tool for the design and optimization of optical thin films. We have developed a reflectivity simulator for non-absorbing dielectric multilayer optical thin films using LabVIEW. The name of the substrate material as well as the material and thickness of each layer of the multilayer stack are fed into the program as input parameters in a pop-up window. The program calculates reflectivity spectrum for the given range of wavelengths using layer thicknesses and dispersion data of refractive indices for the defined stack of dielectric materials. The simulated reflectivity spectra for various combinations of materials in multilayer stacks are presented and compared with the experimental results of the multilayer optical thin films grown by electron-beam evaporation technique.

Multilayer dielectric stack Notch filter for 450-700 nm wavelength spectrum

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