2011
DOI: 10.1016/j.nima.2011.04.056
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Simulation of new p-type strip detectors with trench to enhance the charge multiplication effect in the n-type electrodes

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Cited by 27 publications
(17 citation statements)
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“…Ultra Fast Silicon Detectors, a new concept in silicon detector design, associate the best characteristics of standard silicon sensors with the main feature of Avalanche Photo Diodes (APD). UFSD are thin (typically 50µm thick) silicon Low Gain Avalanche Diodes (LGAD) [9], [10], that produce large signals showing hence a large dV /dt, a characteristic necessary to measure time accurately.…”
Section: Ultra Fast Silicon Detectormentioning
confidence: 99%
“…Ultra Fast Silicon Detectors, a new concept in silicon detector design, associate the best characteristics of standard silicon sensors with the main feature of Avalanche Photo Diodes (APD). UFSD are thin (typically 50µm thick) silicon Low Gain Avalanche Diodes (LGAD) [9], [10], that produce large signals showing hence a large dV /dt, a characteristic necessary to measure time accurately.…”
Section: Ultra Fast Silicon Detectormentioning
confidence: 99%
“…This modification to usual sensor designs should increase the electric field close to the strips. Measurements after irradiation give both for 5 and 50 µm trenches an enhanced collected charge [26,27].…”
Section: Sensors With Enhanced Charge Multiplicationmentioning
confidence: 99%
“…2 shows the schematic description of this approach. Both types of structures have been simulated [6] with a T-CAD package, and possible electric field enhancement has been found. The sensors have been produced by IBN-CNM in Barcelona on 300 mm thick, high resistivity p-type bulk wafers (with expected full depletion voltage of about 80 V).…”
Section: Silicon Microstrip Detectors With Modified Junction Geometrymentioning
confidence: 99%