Simulation of DC electrical ageing in insulating polymer films

Dissado, L.A.; Thabet, Ahmed; Dodd, S.J.

doi:10.1109/tdei.2010.5492263

Cited by 16 publications

(12 citation statements)

References 21 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…However, this conclusion is in contrast to the study with [19] which states that a few of the bonds which failed during the main part of the aging period would be detectable as nano voids, cracks or local conducting regions [20]. The rest of the regions have not reached the critical situation for irreversibility as it is assumed that detecting the changes during the main part of aging period would be difficult.…”

Section: Totalmentioning

confidence: 67%

Simulation of the developed electro-thermal aging model based on trapping and detrapping process

Alghamdi

Vaughan

2015

2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

View full text Add to dashboard Cite

Abstract-The key aspect of this work is to simulate the evolution of structure damages in polyethylene under the effect of electro-thermal stresses based on the trapping and detrapping aging model. In addition, the susceptibility of the model parameters to the isolated sites during the aging period have also been studied. The simulation work is performed on a 2D square grid that is assumed to represent a part of the insulation. The mesh structure is divided using the finite element method. Based on the nature of polyethylene, its structure is semi-crystalline with a spatially varying morphology. Consequently, each bond in the grid is assigned a set of parameter values. One of these parameters is the critical fraction of trapped charges C * , which needs to be reached in order to fail a bond. It is chosen at random values from a range centered on the characteristic value obtained from the experimental results. This indicates that the insulation life at varying parameter C * is lower than its characteristic value.

show abstract

Section: Totalmentioning

confidence: 67%

Simulation of the developed electro-thermal aging model based on trapping and detrapping process

Alghamdi

Vaughan

2015

2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

View full text Add to dashboard Cite

show abstract

“…Thus failure will only occur when A*≤Aeq. Although each theory gives different physical origins for, H, C, ∆, b, and A*, it is preferable to adopt the strategy used in [17,18] of treating them as generic parameters, since their values cannot be determined by experiments other than endurance lifetimes and all theories can fit the field dependence of the characteristic endurance lifetime. Thus CE b can be regarded as a measure of the field energy concentration at a specific location that is available to drive the reaction since the larger CE b the smaller the energy barrier to modification and the greater the amount of change at equilibrium, and A* is a measure of the ability of given location to resist deterioration, i.e.…”

Section: Basic Ageing Modelmentioning

confidence: 99%

“…Previous work [30] has shown that only distributions of C and A* are significant for the lifetime distribution and hence we have assumed that only these parameters will vary on the 25 µm scale of the grid. This variation is represented by the assignment of C and A* values to each grid-bond randomly selected from a distribution shape that approximates the experimentally determined distributions, as in [17,18], and that possesses the experimental characteristic values. These are a uniform distribution of C/k truncated at 1.0 and ∼2.2 K(m/MV) b , and A* from a uniform distribution between the limits of 0.01 and 0.96.…”

Section: Numeric Simulation Of Aging and Breakdownmentioning

confidence: 99%

“…* X A ≥ , this bond (or bonds) is (are) regarded to have failed and become a conductor as would be the case for the 25 µm films of [2]. As in [17,18], the field in the failed matrix bond is assumed to be zero and consequently the field distribution is modified and must be recalculated using the Laplace equation:…”

Section: Numeric Simulation Of Aging and Breakdownmentioning

confidence: 99%

See 1 more Smart Citation

Simulation of electro-thermal ageing and breakdown in polymeric insulation under high frequency trapezoidal-wave pulses

Zuo

Yao

Dissado

et al. 2017

IEEE Trans. Dielect. Electr. Insul.

View full text Add to dashboard Cite

A quantitative ageing model expressed in terms of two generic parameters, one describing the ability of local regions to resist degradation and the other describing their capacity to concentrate energy from the electric field, has been used to simulate the electro-thermal ageing of Polyethylene Terephthalate (PET) in pulsed trapezoidalwave electric fields. Allowance has been made for the dielectric heating produced by the alternate-polarity voltage pulses. It was found that for 90% of the lifetime the degradation was that of isolated regions. Only when the regions started to group to produce a local field in excess of a critical value did the degradation accelerate to failure in the form of a single track. The critical field is associated with the effective onset of irreversibility in the production of degradation, such that a local equilibrium state in the presence of the field was no longer possible regardless of the nature of the surrounding material. The temperature increases were found to be small and had very little influence upon degradation formation, though they had a minor influence on the initiation of runaway failure.

show abstract

“…First, the presence of space charge will locally enhance the electric field. Secondly, space charge may directly cause degradation on a microscopic scale through the electromechanical stress induced by the charge [19], [17], [20].…”

Section: In the Absence Of A Macroscopic Defect: Space Chargementioning

confidence: 99%

Defects and interfaces at DC voltage

Morshuis

2011

Proceedings of 2011 International Symposium on Electrical Insulating Materials

View full text Add to dashboard Cite

In electrical insulating systems, breakdown is usually triggered by macroscopic defects or interfaces. The focus of this paper is on two phenomena that are of prime importance for understanding degradation and breakdown processes at DC voltage, i.e. partial discharge and space charge. An overview is given of the work that was performed in Delft, often in collaboration with other institutes, in the field of DC insulation systems containing such defects and/or interfaces. A significant amount of attention is paid to partial discharge and its dynamics under DC stress. In the absence of partial discharge, space charge is an important trigger for degradation. It is described how space charge affects the electric field in a complicated insulation system such as a cable joint. It is argued that space charge plays a major role in the degradation process. Finally, some challenges in the field of DC insulating materials are suggested.

show abstract

Simulation of DC electrical ageing in insulating polymer films

Cited by 16 publications

References 21 publications

Simulation of the developed electro-thermal aging model based on trapping and detrapping process

Simulation of the developed electro-thermal aging model based on trapping and detrapping process

Simulation of electro-thermal ageing and breakdown in polymeric insulation under high frequency trapezoidal-wave pulses

Defects and interfaces at DC voltage

Contact Info

Product

Resources

About