Simulation of aging effects on radiated emission of microstrip line

Abstract

This paper deals with the influence of humidity and temperature stresses on a microstrip line. These aging factors induce degradation on the dielectric and geometric properties. So the aim of this study is the evaluation of the influence of such variations on the radiated emission of a microstrip line using electromagnetic simulator. Due to the difficulty to interpret and analyze the results because of the correlation between the parameters, we have established a Design Of Experiments (DOE) to optimize the simulation procedure. The result coupled to ANOV A method gives better knowledge on the influence's factors. The study's conclusions lead to simplify the experiment's tests.