2020 21st International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and 2020
DOI: 10.1109/eurosime48426.2020.9152713
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Simulation-Based Analysis of Thermo-Mechanical Constraints in Packages for Diamond Power Devices

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Cited by 3 publications
(2 citation statements)
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“…For example, the difference in CTE and stiffness between diamond and die-attach materials will lead to thermal stress and thus lifetime degradation and reliability issues. Fusté et al [147] simulated the thermomechanical interaction between components in a diamond module. Simulation was conducted for a custom SOT-227 power module (figure 13) with Si, SiC and diamond.…”
Section: Diamond and Aln Devicesmentioning
confidence: 99%
See 1 more Smart Citation
“…For example, the difference in CTE and stiffness between diamond and die-attach materials will lead to thermal stress and thus lifetime degradation and reliability issues. Fusté et al [147] simulated the thermomechanical interaction between components in a diamond module. Simulation was conducted for a custom SOT-227 power module (figure 13) with Si, SiC and diamond.…”
Section: Diamond and Aln Devicesmentioning
confidence: 99%
“…(b) Normal stress distribution at the interface between die and die-attach for diamond, SiC and Si chips. © 2020 IEEE.Reprinted, with permission, from[147].…”
mentioning
confidence: 99%