2001
DOI: 10.1016/s0378-7753(00)00664-9
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Simulation and analysis of time-dependent degradation behavior of AMTEC

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Cited by 11 publications
(5 citation statements)
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“…One of the conclusions obtained by the authors was the existence of a critical current density threshold, at which internal failure of the electrolyte could be expected. In 2000 Lodhi et al [17] simulated the degradation behavior of AMTEC focusing on the BASE. The authors compared the results with empirical data and found that during the first 7000 h of operation almost the entire power loss was attributable to the ionic resistance of the BASE.…”
Section: A History Of Amtec Convertermentioning
confidence: 99%
“…One of the conclusions obtained by the authors was the existence of a critical current density threshold, at which internal failure of the electrolyte could be expected. In 2000 Lodhi et al [17] simulated the degradation behavior of AMTEC focusing on the BASE. The authors compared the results with empirical data and found that during the first 7000 h of operation almost the entire power loss was attributable to the ionic resistance of the BASE.…”
Section: A History Of Amtec Convertermentioning
confidence: 99%
“…Lodhi et al [69,75,78,79] did a lot of simulations to find the effect of electrodes' grain growth on power degradation of PX-3A cells. In the most recent, Lodhi and Briggs [80] [81], as shown in Table III.…”
Section: The Role Of Electrodesmentioning
confidence: 99%
“…However, studies show that BASE and electrodes are two of the most power degrading components in AMTECs. The BASE is the main cause of power degradation, and it alone may contribute to the degradation as much as 50-60% [69]. The power degradation due to electrode is estimated as 15-19% [52].…”
Section: Mechanisms Of Power Degradationmentioning
confidence: 99%
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