Simulation Analysis of the Effect of Measured Parameters on the Emissivity Estimation of Calibration Load in Bistatic Reflection Measurement

Abstract

Abstract-This paper presents the estimation of emissivity of calibration load using discretized scattering simulation data in bistatic reflection measurement, and analyzes the effect of several measured parameters on emissivity of calibration load. In the analysis of the impact of measured parameters on emissivity, a new calibration target is designed to improve the accuracy of emissivity measurement. In this bistatic measurement, the scattering from calibration load is simulated by FDTD (Finite-Difference Time-Domain) method. Based on Kirchhoff's law, the emissivity of calibration load is estimated by the discretized scattering data composed of different scanning angle interval and sampling azimuth planes. By the studies of simulation results, the estimation accuracy of emissivity of calibration load can be improved by selected appropriate measured parameters in bistatic reflection measurement.