Simulating dark-field X-ray microscopy images with wavefront propagation techniques

Carlsen, Mads; Detlefs, C.; Yildirim, Can; Ræder, Trygve Magnus; Simons, Hugh

doi:10.1107/s205327332200866x

Cited by 4 publications

(2 citation statements)

References 29 publications

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“…The simulation assumes kinematical scattering and is otherwise based on Refs. [22,23] with a Gauss-Schell beam [24] of height 0.6 μm and divergence of 0.1 mrad. The electric field is concentrated at the edge of the electrode and the highest electric-field-induced contrast is found here.…”

Section: A Proposed Experimental Realizationmentioning

confidence: 99%

Imaging the electric field with x-ray diffraction microscopy

Ræder,

Petralanda,

Olsen

et al. 2023

Phys. Rev. B

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The properties of semiconductors and functional dielectrics are defined by their response in electric fields, which may be perturbed by defects and the strain they generate. In this work, we demonstrate how diffractionbased x-ray microscopy techniques may be utilized to image the electric field in insulating crystalline materials. By analyzing a prototypical ferro-and piezoelectric material, BaTiO 3 , we identify trends that can guide experimental design towards imaging the electric field using any diffraction-based x-ray microscopy technique. We explain these trends in the context of dark-field x-ray microscopy, but the framework is also valid for Bragg scanning probe x-ray microscopy, Bragg coherent diffraction imaging, and Bragg x-ray ptychography. The ability to quantify electric field distributions alongside the defects and strain already accessible via these techniques offers a more comprehensive picture of the often complex structure-property relationships that exist in many insulating and semiconducting materials.

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Section: A Proposed Experimental Realizationmentioning

confidence: 99%

Imaging the electric field with x-ray diffraction microscopy

Ræder,

Petralanda,

Olsen

et al. 2023

Phys. Rev. B

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“…26 In recent times several works have introduced the capability of retrieving complex x-ray wave-fronts after the sample by using an evolution of these inverse techniques as in the case of tele-ptychography 10,27,28 or dark x-ray field microscopy. 29 Dynamical diffraction theory was widely studied during the decades from the 50s to the 90s. 21,22,[30][31][32][33][34] During these decades, dynamical diffraction was mainly use in the study of thick crystals with both neutrons and xrays.…”

Section: Introductionmentioning

confidence: 99%

Ultrafast dynamical diffraction with nanobeams, simulations on thin Au crystals

Rodriguez-Fernandez

2023

X-Ray Nanoimaging: Instruments and Methods VI

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The diffraction of x-rays in quasi-perfect thin crystals of elements with high Z can generate multiple diffracted beams at the exiting surface of a crystal. These beams propagate in the free space parallel to each other and share the same divergence and monochromatic properties. These beams have a spatial separation that varies between few nm and couples of μm. Due to the different path that the photons follow, these x-ray beams present a temporal delay between each other in the order of the fs. It is for these that the x-ray beams generated by this ultrafast diffraction process are so-called x-ray echoes. The x-ray echoes can only be described using the dynamical diffraction theory formalism. Here, we present simulations with the expected diffracted wave-fronts both in the diffracted and forward direction in several compounds, such as Ni, GaAs, InSb and in particular Au. This work presents also the dependence with energy and thickness of the x-ray echoes. The properties of these x-ray beams can produce ambiguous results while performing temporal studies, that became obvious with fs and sub-fs pulse facilities. Moreover, the spatial overlapping of the echoes can mislead the scientist to think that speckles from a small crystal could be generated from different centers of diffraction, while in reality are a dynamical diffraction effect.

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Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers

Dresselhaus-Marais,

Kozioziemski,

Holstad

et al. 2023

Sci Rep

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The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, dark field X-ray microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $$10^{12}$$ 10 12 photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.

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Simulating dark-field X-ray microscopy images with wavefront propagation techniques

Cited by 4 publications

References 29 publications

Imaging the electric field with x-ray diffraction microscopy

Imaging the electric field with x-ray diffraction microscopy

Ultrafast dynamical diffraction with nanobeams, simulations on thin Au crystals

Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers

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