SIMS depth profiling analysis of electrical arc residues in fire investigation

Microstructural Study on Oxygen Permeated Arc Beads

“…Lee et al [8] used Raman spectroscopy to identify the carbonized residue of electrical molten marks; there was graphitized carbon in the fire-causing arc beads. Chen et al [9] used the secondary ion mass spectrometer to measure the depth profile; the surface layer enriched with C, Cl, and O was observed in the fire-causing arc beads.…”

Fire investigation and ignitable liquid residue analysis—A review: 2001–2007

“…Raman spectroscopy and SEM-EDX were used to distinguish between primary and secondary molten (arc) marks by examination of the carbon residue remaining on molten marks caused by the short-circuit of PVC-coated wire [116]. Arc beads have also been analyzed using secondary ion mass spectrometry (SIMS) to determine whether a primary or secondary short-circuit had occurred [117]. A detailed review of the methods used to distinguish primary (''cause'') and secondary (''victim'') arc marks have been presented [118,119].…”

Metallurgical and Composition Analysis of Melted Marks Due to Electrical Failures

“…Optical microscope has been commonly used for visual inspection of the microstructure, in which properties like porosity and cross-sectional metallurgical phases of the arc beads are investigated. Some other means of physical or chemical testing, such as simple visual observation of the macrostructure, secondary ion mass spectrometry (SIMS) and dendrite arm spacing (DAS) methods, have been proposed to analysis the melting mark of copper wires residues found in fire scenes [1][2][3][4][5][6][7][8]. However, most of the methods only entail subjective, qualitative criteria for distinguishing between beads that did or did not start a fire.…”