Simplified electrical test procedures for components of isolated LPS

Beierl, Ottmar; Brocke, Ralph; Rother, Claudia

doi:10.1109/iclp.2010.7845839

2010 30th International Conference on Lightning Protection (ICLP) 2010

DOI: 10.1109/iclp.2010.7845839

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Simplified electrical test procedures for components of isolated LPS

Ottmar Beierl

Ralph Brocke²,

Claudia Rother³

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Evaluation of the Electric Stress on an Insulating Down-Conductor Caused by Lightning Strikes through ATP-EMTP Simulations

Samaras,

Staikos,

Datsios

et al. 2023

2023 IEEE Industry Applications Society Annual Meeting (IAS)

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Simplified electrical test procedures for components of isolated LPS

Cited by 6 publications

References 0 publications

Evaluation of the Electric Stress on an Insulating Down-Conductor Caused by Lightning Strikes through ATP-EMTP Simulations

Evaluation of the Electric Stress on an Insulating Down-Conductor Caused by Lightning Strikes through ATP-EMTP Simulations

Distribution of real lightning strokes and their influence on test procedures for isolated LPS

Influence of humidity and pollution on the dielectric strength of components used in Isolated LPS

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