Simple Theory Concerning the Reflection of Electrons from Solids

Everhart, T. E.

doi:10.1063/1.1735868

Cited by 221 publications

(72 citation statements)

References 9 publications

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“…Nascap-2k uses a backscattering theory [21] based on that of Everhart [22] as extended by McAfee. [23] It assumes a single scattering in accordance with the Rutherford cross-section and the Thomson-Widdington slowing down law,…”

Section: Backscattermentioning

confidence: 99%

Plasma Interactions with Spacecraft. Volume 2, NASCAP-2K Scientific Documentation for Version 4.1

Davis¹,

Mandell²

2011

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Section: Backscattermentioning

confidence: 99%

Plasma Interactions with Spacecraft. Volume 2, NASCAP-2K Scientific Documentation for Version 4.1

Davis¹,

Mandell²

2011

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“…counts per second) measured without an absorber, A is the activity measured through an absorber of thickness 1, and k, is the absorption coefficient and an approximately linear function of the absorber's density. dependence (14). In view of different energy distributions from different isotopes and the distinct upper limit in energy of any p radiation, clearly the above equation can only approximate the true distribution within a certain range.…”

Section: Luminescence Measurementsmentioning

confidence: 99%

“…The efficiency of the scattering and emission processes depends strongly on the atomic number of the solid and the angle of incidence: the heavier the material and the larger the angle of incidence, i.e. the more shallow the impact, the larger is the number of secondary electrons created (13)(14)(15). Gas-phase ionization resulting from such secondary electrons occurs very close to the surface.…”

Section: Scattering and Secondary Electron Emission In Solid Phasesmentioning

confidence: 99%

⁶³Ni β range and backscattering in confined geometries

Siu¹,

Aue²

1987

Can. J. Chem.

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Can. J. Chem. 65, 1012(1987.To know the spatial distribution of ion pairs resulting from 63Ni P radiation in the gas phase is important for a variety of theoretical and practical reasons, in particular those concerning the electron capture detector. Literature estimates of this distribution vary by about one order of magnitude, yet this parameter is necessary for the modelling of this detector. The 63~i-induced, initial ion pair distribution was therefore measured in a variety of gases with two techniques: a conventional one based on the electrical saturation current at variable interelectrode distances, and an unconventional one based on luminescence from a plastic scintillator. The data are analyzed in terms of two ranges, d50 and d 9 5 , that describe the distances from a planar radioactive foil within which 50% and 95% of the total gas-phase ionization occur. The data from the electrical measurement show unexpected evidence of strong P backscattering and secondary electron emission from the counter-electrode. Under these (non-exponential) conditions, d50 values in the common detector gases nitrogen and argonlmethane vary from 0.5 to 1.0 mm, depending on the nature of the counter-electrode. Calculations based on the quasi-exponential range found at longer distances in electrical measurements yield values of about 2.5 mm (which are low because of geometric measurement bias). In contrast, the data from the luminescence measurement are almost completely exponential and d50 values for argon ( + 5 % methane) and nitrogen are 2.8 and 3.8 mm, respectively. The d95 values vary from 12 to 16 mm for the luminescence, to 6 and 9 mm for the (less reliable) electrical measurement; all at ambient conditions. The luminescence data are considered closer to the "true" (unimpeded) charge distribution, while the ionization data may be closer to the initial charge topography inside an electron capture detector of confining geometry. All range data, however, are short enough to advise modelling thc dctector as a system with strongly heterogeneous charge distribution. No evidence was found for some of the very large range estimates found in the literature. Conndtre la distribution spaciale des paires d'ions provenant de la radiation P du 6 3~i est important pour diverses raisons thtoriques et pratiques, en particulier celles concernant le dktecteur a capture d'klectrons. Les valeurs de la litterature, pour cette distribution, varient par environ un ordre de grandeur; pourtant ce parametre est nicessaire a la rtalisation d'un modkle de ce dktecteur. La distribution initiale des paires d'ions, induite par le 6 3~i fut donc mesurke dans divers gaz au moyen de deux techniques : I'une conventionnelle, basee sur le courant de saturation Clectrique a des distances interClectrodes variables; et l'autre peu conventionnelle, basee sur la luminescence d'un scintillateur en plastique. Les donnies sont analysies en fonction de deux distances, d50 et d 9 5 , qui decrivent les intervalles jusqu'ii une feuille radioactive planaire, a l'intkrieur...

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“…In the general case, the reported analytical expressions for the BSE energy spectra are rather complicated and controversial. In the present work, we used the formulae for the spectra and coefficients η(E) as obtained in Everhart (1960) and Iafrate et al (1976). In those works, the samples consisting of two layers, namely, the infinite substrate and the thin coating layer, were investigated.…”

Section: Image Contrast Of Subsurface Structuresmentioning

confidence: 99%

Fundamental problems of imaging subsurface structures in the backscattered electron mode in scanning electron microscopy

Рау

Reimer

2001

Scanning

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Summary:In-depth imaging of subsurface structures in scanning electron microscopy (SEM) is usually obtained by detecting backscattered electrons (BSE). For a layer-bylayer imaging in BSE microtomography, it is preferable to use an energy filtering of BSE. A simple approach is used to estimate the contrast by using backscattering coefficients of bulk materials and the maximum escape depths of the BSE. The contrast obtained by BSE energy filtering is about twice that of the standard BSE method by varying the acceleration voltage. The contrast decreases with increasing information depth. The information depth is about four times smaller than the electron range. The transmission of the spectrometer influences the minimum current of the order of 10 −8 A that is needed to get a contrast of 1%, for example.

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Simple Theory Concerning the Reflection of Electrons from Solids

Cited by 221 publications

References 9 publications

Plasma Interactions with Spacecraft. Volume 2, NASCAP-2K Scientific Documentation for Version 4.1

Plasma Interactions with Spacecraft. Volume 2, NASCAP-2K Scientific Documentation for Version 4.1

⁶³Ni β range and backscattering in confined geometries

Fundamental problems of imaging subsurface structures in the backscattered electron mode in scanning electron microscopy

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Simple Theory Concerning the Reflection of Electrons from Solids

Cited by 221 publications

References 9 publications

Plasma Interactions with Spacecraft. Volume 2, NASCAP-2K Scientific Documentation for Version 4.1

Plasma Interactions with Spacecraft. Volume 2, NASCAP-2K Scientific Documentation for Version 4.1

63Ni β range and backscattering in confined geometries

Fundamental problems of imaging subsurface structures in the backscattered electron mode in scanning electron microscopy

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Product

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⁶³Ni β range and backscattering in confined geometries