2017
DOI: 10.1364/jot.84.000260
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Simple phase shifting lateral shearing interferometer based on a thick birefringent plate

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“…But the requirements for the fabrication accuracy of the grating are very high, and the lateral sampling resolution is low, which leads to the great limitation of its imaging resolution [17,18]. Moreover, the non-common optical path system is difficult to debug and easy to produce additional errors [19][20][21]. Such as, there are some inventions about a phase-shifting lateral shearing interferometer, a polarization phase-shifting double shearing interference wavefront measuring instrument, and its test method [22].…”
Section: Introductionmentioning
confidence: 99%
“…But the requirements for the fabrication accuracy of the grating are very high, and the lateral sampling resolution is low, which leads to the great limitation of its imaging resolution [17,18]. Moreover, the non-common optical path system is difficult to debug and easy to produce additional errors [19][20][21]. Such as, there are some inventions about a phase-shifting lateral shearing interferometer, a polarization phase-shifting double shearing interference wavefront measuring instrument, and its test method [22].…”
Section: Introductionmentioning
confidence: 99%