This Report characterizes the defect reaction network in carbon doped, p-type GaAs deduced from first principles density functional theory. The reaction network is deduced by following exothermic defect reactions starting with the initially mobile interstitial defects reacting with common displacement damage defects in C-doped GaAs until culminating in immobile reaction products. The defect reactions and reaction energies are tabulated, along with the properties of all the carbon-related defects in the reaction network. This Report serves to extend the results for intrinsic defects in: P.A. Schultz and O.A. von Lilienfeld, "Simple intrinsic defects in GaAs", Modelling Simul. Mater. Sci Eng., Vol. 17, 084007 (2009)