Simple Hybrid Model for Estimating Remaining Useful Life of SiC MOSFETs in Power Cycling Experiments
Mattias P. Eng,
Andreas Lövberg,
Maciej Misiorny
et al.
Abstract:Recording and prediction of the accumulated damage, which will eventually lead to the failure of power electronic modules, is an aspect of high importance for power electronic systems design and, in particular, for development of Prognostic and Health Management (PHM) schemes for in-field applications. To this end, this paper presents a simple and cost-effective prognostic method for predicting the remaining useful life (RUL) of TO-247 packaged silicon carbide (SiC) metal-oxide semiconductor field-effect trans… Show more
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