2011
DOI: 10.1111/j.1365-2818.2011.03518.x
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Simple characterisation of a deformable mirror inside a high numerical aperture microscope using phase diversity

Abstract: SummaryWe present a simple and versatile scheme for characterising amplitude and phase modulation by an active element, such as a deformable mirror, in the pupil plane of a high NA microscope. By placing a mirror in the vicinity of the focal plane of the objective and recording images of the reflected focal spot on a camera, we show that reliable measurements of the influence function of the mirror actuators in the pupil plane of the objective can be obtained using an iterative electric field retrieval algorit… Show more

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Cited by 14 publications
(16 citation statements)
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“…The algorithm is presented in more details in 10 . Briefly, the guess for Π tot ( r) at iteration i was used to calculate three 2D amplitude PSFs corresponding to positions z 0 , 0 and −z 0 .…”
Section: Electric Field Retrievalmentioning
confidence: 99%
See 1 more Smart Citation
“…The algorithm is presented in more details in 10 . Briefly, the guess for Π tot ( r) at iteration i was used to calculate three 2D amplitude PSFs corresponding to positions z 0 , 0 and −z 0 .…”
Section: Electric Field Retrievalmentioning
confidence: 99%
“…One of the benefits of our scheme is that it can be used to characterise the properties of an adaptive microscope for several objectives with different magnifications and numerical apertures, without modification of the measuring scheme 10 . Here we illustrate this property on the example of two different objectives: a 25x, 1.05NA and a 60x, 1.2NA objective (Olympus).…”
Section: Adaptive Microscope Characterizationmentioning
confidence: 99%
“…A range of such methods have been developed specifically for use in microscopes, using interferometry, 23 image based measurements 24,25 and phase diversity. 26,27 Spatial light modulators have been used less frequently in microscopes for aberration correction, due to their polarisation dependent operation and sensitivity to wavelength when used in the common modulo 2p mode. They do, however, have many additional uses in microscopy.…”
Section: Adaptive Correction Elementsmentioning
confidence: 99%
“…Using a phase retrieval algorithm [52,53], the phase and intensity distribution in the pupil can be recovered from defocused PSFs [52] and then used as input to a calibrated DM. However, the images need to be of point-like objects otherwise, for extended object images, the knowledge of the object function is also required, which is rarely the case 1 .…”
Section: Phase Retrieval Techniquementioning
confidence: 99%
“…The algorithm suggested in [52,53] where phase and intensity in the pupil can be recovered is in fact, an extension of the Gerchberg-Saxton algorithm [54], where phase only is recovered from a known intensity distribution in the pupil. From the starting phase and uniform amplitude, the PSF is computed and then compared to the measured one.…”
Section: Phase Retrieval Techniquementioning
confidence: 99%