2012
DOI: 10.1504/ijict.2012.048758
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Similarity measures for automatic defect detection on patterned textures

Abstract: Similarity measures are widely used in various applications such as information retrieval, image and object recognition, text retrieval, and web data search. In this paper, we propose similarity-based methods for defect detection on patterned textures using five different similarity measures, viz., Normalized Histogram Intersection Coefficient, Bhattacharyya Coefficient, Pearson Product-moment Correlation Coefficient, Jaccard Coefficient and Cosine-angle Coefficient. Periodic blocks are extracted from each inp… Show more

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Cited by 12 publications
(8 citation statements)
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“…A low MSE, high PSNR, UIQI and SSIM closer to 1 indicate that the distortion in the steo image is not at significant level. Table 2 shows the result of security analysis (SA) [3,9] measures, including Jaccard Measure (J), Intersection (I), Correlation (C), Chi-Square (CS) and Bhattacharya (B), computed between the cover and stego images of Figure 1.…”
Section: Resultsmentioning
confidence: 99%
“…A low MSE, high PSNR, UIQI and SSIM closer to 1 indicate that the distortion in the steo image is not at significant level. Table 2 shows the result of security analysis (SA) [3,9] measures, including Jaccard Measure (J), Intersection (I), Correlation (C), Chi-Square (CS) and Bhattacharya (B), computed between the cover and stego images of Figure 1.…”
Section: Resultsmentioning
confidence: 99%
“…Similarity measurement can be used to distinguish the defective and defect-free regions [14] in a patterned texture. The algorithm used for defect detection in this paper is the similarity measurement of a statistical histogram of periodic units.…”
Section: Classification Of the Periodic Units Based On Similarity Meamentioning
confidence: 99%
“…For complete analysis of the proposed scheme different parameters are used, which are divided into following categories [9,27] …”
Section: A Performance Metricsmentioning
confidence: 99%