1998
DOI: 10.1109/2944.736079
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Silicon oxynitride planar waveguiding structures for application in optical communication

Abstract: The refractive index of silicon oxynitride (SiON), a widely used material for integrated optics devices, can be chosen in a wide range between 1.45-2.0. We describe how the consequent large design freedom can be exploited on the one hand for a "standard" polarization independent optical channel waveguide having a favorable tradeoff between efficient fiberchip coupling and small bend radii (compact devices) and on the other hand for special-purpose and hybrid components where the refractive index should be fine… Show more

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Cited by 101 publications
(60 citation statements)
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References 26 publications
(24 reference statements)
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“…All measurements were performed at the wavelength of 1550 nm. We estimated the bend loss using the simple expression [29] Loss (2) and obtained good agreement with the experimental results. The total insertion loss through a 13-mm-long sample, which contained straight waveguides and S-bends, as a function of curvature radius is shown in Fig.…”
Section: S-bendssupporting
confidence: 52%
“…All measurements were performed at the wavelength of 1550 nm. We estimated the bend loss using the simple expression [29] Loss (2) and obtained good agreement with the experimental results. The total insertion loss through a 13-mm-long sample, which contained straight waveguides and S-bends, as a function of curvature radius is shown in Fig.…”
Section: S-bendssupporting
confidence: 52%
“…Both types of nitride have been used for photonic ICs. In the telecom band around 1.55 µm it is common to use LPCVD nitride to avoid the absorption due to N-H and Si-H bonds around 1.52 µm [42]. To this end the LPCVD nitride is annealed at high temperature to drive out the hydrogen.…”
Section: Silicon Photonics Platformsmentioning
confidence: 99%
“…Both types of nitride have been used for photonic ICs. In the telecom band around 1550 nm it is common to use LPCVD nitride to avoid the absorption due to N-H and Si-H bonds around 1520 nm [5]. To this end the LPCVD nitride is annealed at high temperature to drive out the hydrogen.…”
Section: Silicon Nitridementioning
confidence: 99%