The characteristic effects of doping with impurities such as Si,
Ge, Se, O, Mg, Be, and Zn on the electrical and optical properties
of GaN-based materials are reviewed. In addition, the roles of
unintentionally introduced impurities, such as C, H, and O, and
grown-in defects, such as vacancy and antisite point defects,
are also discussed. The doping process during epitaxial growth
of GaN, AlGaN, InGaN, and their superlattice structures is
described. Doping using the diffusion process and ion implantation
techniques is also discussed. A p-n junction formed by
Si implantation into p-type GaN is successfully fabricated. The
results on crystal structure, electrical resistivity, carrier
mobility, and optical spectra obtained by means of x-rays, low-temperature
Hall measurements, and photoluminescence are also discussed.