Silicon/Chromium based thin films -a way to Zernike phase plates with long-term stability?

Irsen, Stephan; Lenz, Johannes; Kurth, Patrick

doi:10.1017/s1431927612004291

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2013

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“…We first tried iridium, the most corrosion-resistant metal known, and then rhodium because it has a lower atomic number (resulting less electron scattering). We also tried chromium, because of an earlier report of its use (Irsen et al, 2012). In addition, we tried an experimentally applied proprietary carbon-based coating, as well as sputter-coated carbon.…”

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confidence: 99%

Methods for testing Zernike phase plates and a report on silicon-based phase plates with reduced charging and improved ageing characteristics

Marko

Meng

Hsieh

et al. 2013

Journal of Structural Biology

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Imaging with Zernike phase plates is increasingly being used in cryo-TEM tomography and cryo-EM single-particle applications. However, rapid ageing of the phase plates, together with the cost and effort in producing them, present serious obstacles to widespread adoption. We are experimenting with phase plates based on silicon chips that have thin windows; such phase plates could be mass-produced and made available at moderate cost. The windows are coated with conductive layers to reduce charging, and this considerably extends the useful life of the phase plates compared to traditional pure-carbon phase plates. However, a compromise must be reached between robustness and transmission through the phase-plate film. Details are given on testing phase-plate performance by means of imaging an amorphous thin film and evaluating the power spectra of the images.

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Section: 0 Results and Discussionmentioning

confidence: 99%

Methods for testing Zernike phase plates and a report on silicon-based phase plates with reduced charging and improved ageing characteristics

Marko

Meng

Hsieh

et al. 2013

Journal of Structural Biology

View full text Add to dashboard Cite

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Silicon/Chromium based thin films -a way to Zernike phase plates with long-term stability?

Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Cited by 1 publication

References 3 publications

Methods for testing Zernike phase plates and a report on silicon-based phase plates with reduced charging and improved ageing characteristics

Methods for testing Zernike phase plates and a report on silicon-based phase plates with reduced charging and improved ageing characteristics

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