1998
DOI: 10.1016/s0254-0584(98)80014-x
|View full text |Cite
|
Sign up to set email alerts
|

Silicides and ohmic contacts

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

4
229
0

Year Published

2003
2003
2023
2023

Publication Types

Select...
5
3
1

Relationship

0
9

Authors

Journals

citations
Cited by 373 publications
(233 citation statements)
references
References 290 publications
4
229
0
Order By: Relevance
“…In recent years nickel silicides, intermetallic compounds of silicon and nickel, have been proposed as candidates for replacing aluminum alloys for applications in very large-scale integrated circuits (VLSI) [1][2][3][4] and in ultra large-scale integrated circuits (ULSI) [3][4][5], because they show metallic behavior with low electrical resistivity, high electro-migration resistance, high thermal stability and resistance to acids [1,4]. Nickel silicides can be formed by solid-state reaction of Si and thin nickel films, deposited on Si wafer, at a temperature well below the eutectic temperature of the system [6][7][8][9][10][11][12], although other techniques such as explosive silicidation [13], reactive deposition [14] and ion implantation [15][16][17] can also be used.…”
Section: Introductionmentioning
confidence: 99%
“…In recent years nickel silicides, intermetallic compounds of silicon and nickel, have been proposed as candidates for replacing aluminum alloys for applications in very large-scale integrated circuits (VLSI) [1][2][3][4] and in ultra large-scale integrated circuits (ULSI) [3][4][5], because they show metallic behavior with low electrical resistivity, high electro-migration resistance, high thermal stability and resistance to acids [1,4]. Nickel silicides can be formed by solid-state reaction of Si and thin nickel films, deposited on Si wafer, at a temperature well below the eutectic temperature of the system [6][7][8][9][10][11][12], although other techniques such as explosive silicidation [13], reactive deposition [14] and ion implantation [15][16][17] can also be used.…”
Section: Introductionmentioning
confidence: 99%
“…Chemical analysis revealed that the Ni to Si ratio has a gradient from bottom to surface of the layer. The reaction of Ni and Si causes the compressive stress by volume changes at the silicide interface (Gergaud et al, 2003;Gambino & Colgan, 1998) as well as by the different mobility between the Ni and Si (Gambino & Colgan, 1998). The Si bonds are softened by intermixing of Si and Ni atoms and existing Ni in the interface of Ni and Si (Ottaviani, 1981).…”
Section: Catalyst Effectsmentioning
confidence: 99%
“…This implies that the reaction of Ni and Si controls the silicide formation. Due to the equilibrium phase is determined by the ratio of Ni atoms to Si atoms (Gambino & Colgan, 1998), the thinner film tends to be a Si rich silicide and the thicker film prefers to be a Ni rich phase (Julies et al, 1999;Zheng et al, 1983). Thermodynamically, the large grains get larger by the tendency to reduce the surface free energy.…”
Section: Wwwintechopencommentioning
confidence: 99%
“…5) In addition, the disilicide has found wide applications as a thin film in microelectronics, as a result of its high electrical conductivity, high-temperature stability, corrosion resistance, and the ability to form good contacts with silicon. 6,7) However, as in the case of many similar compounds, the current concern about these materials (MoSi 2 and NbSi 2 ) focuses on their low fracture toughness below the ductile-brittle transition temperature.…”
Section: Introductionmentioning
confidence: 99%