2008
DOI: 10.1016/j.jnoncrysol.2008.06.021
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Silica nano-rings and nano-hollows: Preparation and UV photoluminescence emission

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Cited by 2 publications
(3 citation statements)
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“…Any UV emission ranging from 364 to 384 nm can be resonantly coupled to Ag NCs formed by ion implantation [20].This wavelength range is suitable for emission from interface states between the Si and its oxide namely the -SiO 3 group, which o Si structural surface and results in a strong 370 nm PL [21]. Similar broadband UV emission has been reported in silica nano-rings coated with ultra-thin Ag films [22]. However, the emission from these annealed Silica nano-rings in the presence of Ag were limited to the emission at higher energy > 2.9 eV.…”
Section: Resultssupporting
confidence: 56%
“…Any UV emission ranging from 364 to 384 nm can be resonantly coupled to Ag NCs formed by ion implantation [20].This wavelength range is suitable for emission from interface states between the Si and its oxide namely the -SiO 3 group, which o Si structural surface and results in a strong 370 nm PL [21]. Similar broadband UV emission has been reported in silica nano-rings coated with ultra-thin Ag films [22]. However, the emission from these annealed Silica nano-rings in the presence of Ag were limited to the emission at higher energy > 2.9 eV.…”
Section: Resultssupporting
confidence: 56%
“…The formation of ^Si-O-O-Si^defects is dependent on the concentration of Ag nanoparticles and temperature. 27,28 The reactions between Ag and SiO 2 may result in the formation of ^Si-O-O-Sid efects, and the formation mechanism was proposed in a previous study. 28 In addition, at high temperature, ^Si-Sid efects may transform into ^Si-O-O-Si^defects by the reaction between ^Si-Si^defects and O 2 .…”
Section: Inuence Of Sintering Temperature On Existing States Of Ag I...mentioning
confidence: 93%
“…27,28 The reactions between Ag and SiO 2 may result in the formation of ^Si-O-O-Sid efects, and the formation mechanism was proposed in a previous study. 28 In addition, at high temperature, ^Si-Sid efects may transform into ^Si-O-O-Si^defects by the reaction between ^Si-Si^defects and O 2 . 24 The presence of defect centers from pure SiO 2 was further conrmed by excitation spectra, as shown in the inset of Fig.…”
Section: Inuence Of Sintering Temperature On Existing States Of Ag I...mentioning
confidence: 93%