2018
DOI: 10.7567/apex.11.071401
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Significant photoresponsivity enhancement of polycrystalline BaSi2 films formed on heated Si(111) substrates by sputtering

Abstract: We fabricated approximately 200-nm-thick BaSi2 films on Si(111) substrates at 600 °C. The formation of BaSi2 was demonstrated by X-ray diffraction and Raman spectroscopy. A reduction in the electron concentration (n = 2 × 1016 cm−3) by 3 orders of magnitude compared to that previously reported (n = 7 × 1019 cm−3) and resultant photoresponsivity enhancement by more than two orders of magnitude were achieved. The photoresponsivity increased with the bias voltage Vbias applied between the top and bottom electrode… Show more

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Cited by 20 publications
(27 citation statements)
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References 29 publications
(38 reference statements)
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“…This is because we need to set TS at 600 °C upon the formation of BaSi2 films by sputtering. [25][26][27] We see the change in color and aggregates on the surface of sample ITO- O atoms from the ITO underlayers. We ascribed this Raman line to substances such as Ba oxides 35) and Si gel.…”
Section: Mbe Is a Very Powerful Technique To Conduct Fundamental Studies Such As The Effect Ofmentioning
confidence: 92%
“…This is because we need to set TS at 600 °C upon the formation of BaSi2 films by sputtering. [25][26][27] We see the change in color and aggregates on the surface of sample ITO- O atoms from the ITO underlayers. We ascribed this Raman line to substances such as Ba oxides 35) and Si gel.…”
Section: Mbe Is a Very Powerful Technique To Conduct Fundamental Studies Such As The Effect Ofmentioning
confidence: 92%
“…Figure 2a shows the Ba and Si atomic ratios of the films. [70] The ratios depend on P, probably because of the significant differences among the atomic weights of Si (28.08), Ar (39.95), and Ba (137.33). The broken lines represent the results of samples sputtered without Ba sources, whereas the solid lines show the results with one plate-like Ba source (1.0 Â 1.5 cm 2 ) on the BaSi 2 target.…”
Section: Basi 2 Films On Si Substratesmentioning
confidence: 99%
“…The slight increase in the electron concentration shown in Figure 3c is probably caused by the defects induced in the deposited films due to sputtering under high P BaSi2 . [70] Copyright 2018, Japan Society of Applied Physics. c) Ba and Si atomic ratios as a function of P BaSi2 with two additional Ba sources on the BaSi 2 target.…”
Section: Basi 2 Films On Si Substratesmentioning
confidence: 99%
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“…Here, we discuss why the Ba-to-Si atomic ratio depends on P. Figure 3(b) shows the experimentally obtained P dependence of deposition rate of sputtered films when the substrate temperature was set at RT to prevent the diffusion of Si atoms from the Si substrate. 25) The increase of P has both positive and negative contributions to the deposition rate due to the increase of both the sputtering yield and the scattering degree between Ar and sputtered particles. The fact that the deposition rate decreased as the P increased suggests that the latter effect appeared significant.…”
mentioning
confidence: 99%