Signal characteristics of IR transceiver pair during two phase flow of varying liquid film thickness in a mini-channel

Mithran, N.; Venkatesan, M.

doi:10.1080/00986445.2020.1791834

Cited by 2 publications

(1 citation statement)

References 21 publications

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“…Julien et al [7] proposed a method of synchronizing the film thickness map obtained by thermal imaging image and near-infrared light absorption imaging in the film, which reduces the correlation between boundary layer thickness and temperature. Mithran et al [8] used an infrared transceiver to analyze the signal characteristics of the device to measure the thickness of the liquid film and the length of the gas bomb. The Near Infrared NIR absorption method belongs to the point liquid film measurement method with high temporal and spatial resolution.…”

Section: Introductionmentioning

confidence: 99%

Effect of System Pressure on Liquid Film Behavior in Horizontal Annular Flow

Zhao¹,

Zhang²,

Zang³

et al. 2023

Proceedings of the 19th International Flow Measurement Conference 2022 on Flow Measurement - FLOMEKO 2022

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The measurement of liquid film parameters is of great significance in the momentum transfer and heat transfer characteristics of gas-liquid two-phase in annular flow. The liquid film at the bottom of the horizontal annular flow is the thickest and produces the greatest influence on the nature of the annular flow. In large diameter horizontal pipes, the effect of pressure on liquid film behavior lacks systematic discussion. Therefore, a dynamic measurement system for annular flow liquid film was designed based on near-infrared(NIR) sensing technology to complete the measurement of annular flow liquid film thickness data under five pressures. The average liquid film thickness at the bottom is obtained by variational modal decomposition(VMD) of the time series signal, and the wave velocity parameter is obtained by mutual correlation velocimetry. The article initially discusses the effect of pressure on the average thickness of the bottom liquid film as well as the interfacial wave velocity.

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Section: Introductionmentioning

confidence: 99%