1975
DOI: 10.1016/s0065-2539(08)61205-6
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Signal and Noise Properties of Gallium Arsenide Microwave Field-Effect Transistors

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Cited by 444 publications
(144 citation statements)
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“…The conventional equivalent circuit used for noise performance evaluation [8,11] is shown with solid lines in Fig. 2, whereas in our present model, an additional gate-to-drain capacitance (C gd ), is added, which is denoted by dotted line.…”
Section: Influence Of Gate-to-drain Capacitancementioning
confidence: 99%
See 1 more Smart Citation
“…The conventional equivalent circuit used for noise performance evaluation [8,11] is shown with solid lines in Fig. 2, whereas in our present model, an additional gate-to-drain capacitance (C gd ), is added, which is denoted by dotted line.…”
Section: Influence Of Gate-to-drain Capacitancementioning
confidence: 99%
“…However, for improving the accuracy of microwave and millimeterwave circuit design, a comprehensive and accurate active device model is imperative. The authors in their recent work proposed a charge control model based on Pucel's noise theory [8][9][10] for the noise performance evaluation of a symmetric tied-gate InAlAs/InGaAs double-gate HEMT [11]. Superior noise performance was observed for the DG-HEMT as compared to the SG-HEMT in terms of lower noise resistance and lower Minimum Noise Figure. The analytical results thereby obtained for the operating frequency of 94 GHz and at a high drain voltage of 0.5V were observed to show good agreement with the ATLAS device simulation results [12] and the earlier reported Monte Carlo simulation and experimental results [1].…”
Section: Introductionmentioning
confidence: 99%
“…Also neglected here is the small 'bandgap narrowing effect due to doping variation. Where d is the reduced potential at the drain, and is given by (Pucel, 1975 Differentiating (14) with respect to Y, Z' hence Qg can be evaluated.…”
Section: Bohannel Currentmentioning
confidence: 99%
“…For this reason, a large number of circuit designers still uses the older and cheaper measurement setups, resulting in time-consuming noise measurements. Consequently, different transistor noise models were developed [1][2][3][4][5][6][7][8][9] in order to provide more efficient transistor noise analysis within circuit simulators. Most of the proposed transistor noise models represent the noise generated in a component using equivalent voltage and/or current sources [3,[5][6].…”
Section: Introductionmentioning
confidence: 99%