2004
DOI: 10.1088/0268-1242/19/10/002
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Si/SiGe heterostructure parameters for device simulations

Abstract: This paper is based on a comprehensive review of the literature and our own studies. We present a summary of the theoretical models and related empirical expressions to evaluate parameters related to the carrier transport within Si/SiGe heterostructures. The models and expressions include the effects of alloy composition and mechanical strain on the band structure of Si/SiGe alloys and the corresponding interfaces. They are presented in a form suitable for implementation in various types of device simulators. … Show more

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Cited by 136 publications
(69 citation statements)
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“…The two-dimensional electron gas is defined in the thin silicon layer with tensile strain. 38,87 The in-plane effective mass is isotropic, given by the transverse mass of the X valley states, 41 and we use m = 0.198m e , 88 where m e is the free-electron mass. The effective Landé factor is g = 2.…”
Section: Modelmentioning
confidence: 99%
“…The two-dimensional electron gas is defined in the thin silicon layer with tensile strain. 38,87 The in-plane effective mass is isotropic, given by the transverse mass of the X valley states, 41 and we use m = 0.198m e , 88 where m e is the free-electron mass. The effective Landé factor is g = 2.…”
Section: Modelmentioning
confidence: 99%
“…Both lateral field-dependent and perpendicular field dependent mobility models [8] have been used in the calibration, along with parameter modifications accounting for strain effects within the Si/SiGe heterostructure [9]. The calibrated device structures and doping profiles are then fed into our Monte Carlo device simulator.…”
Section: Device Calibrationmentioning
confidence: 99%
“…Devices strained with different materials successfully attract attention and are still under explored [1,2]. Strained transistors are one of potential candidates for the next generation high-performance devices technology.…”
Section: Introductionmentioning
confidence: 99%