Si Nanocrystal Arrays Created in SiO2 Matrix by High-Energy Ion Bombardment

Thin V2O5 films synthesized by plasma-enhanced atomic layer deposition for memristive applications

“…In more detail, the trap recharging in the multibarrier system is considered in ref. 45. So, a decrease in the measurement frequency leads to a recharging of a higher number of traps and, thus, the magnitude of the peaks at the C-V characteristics is increased.…”