Si(Li) semiconductor detector in angle and energy dispersive X-ray diffractometry

Laine, E.; Lähteenmäki, I.; Hamalainen, I

doi:10.1088/0022-3735/7/11/026

Cited by 15 publications

(1 citation statement)

References 16 publications

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“…Some subsequent applications of the energy dispersive X-ray diffraction (EDXD) powder method on laboratory instruments have been reported (e.g. Drever & Fitzgerald, 1970;Ferrel, 1971;Laine et al, 1974;Nakajima et al, 1976;Nuding et al, 1980;Eisenreich & Engel, 1983;Uno & Ishigaki, 1984). The rather poor intrinsic resolution of the EDXD system has severely limited its application in structural analysis.…”

Section: Introductionmentioning

confidence: 99%

Rietveld refinements on laboratory energy dispersive X-ray diffraction (EDXD) data

Ballirano

Caminiti

2001

J Appl Crystallogr

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Rietveld re®nements of corundum, a rutile and anatase nanocrystalline synthetic mixture, and gypsum, on laboratory energy dispersive X-ray diffraction (EDXD) data are reported. Cell parameters, positional and displacement parameters are in reasonable agreement with single-crystal reference data, despite the rather poor resolution of EDXD data. In particular, good results were obtained for gypsum (unrestrained re®nement) with counting times as short as 1000 s.

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Section: Introductionmentioning

confidence: 99%

Rietveld refinements on laboratory energy dispersive X-ray diffraction (EDXD) data

Ballirano

Caminiti

2001

J Appl Crystallogr

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Detectors and Detection Electronics

Jenkins

Snyder

1996

Introduction to X‐ray Powder Diffractometry

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X‐ray diffractometry of airborne particulates deposited on membrane filters

O’Connor¹,

Jaklevic²

1980

X-Ray Spectrometry

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Methods are considered for optimizing a conventional Bragg-Brentano X-ray powder diffractometer for the identification of crystalline phases in airborne particulates deposited on membrane filters. The instrumental parameters investigated include detector stepping increment and scan range, KO filtration, and the incident beam divergence slit width. Sample-related factors such as substrate material (cellulose ester, polycarbonate and polytetrafluoroethylene), off-axis displacement of the sample and X-ray induced specimen degradation were also studied. Scan times for sample deposits of several hundred pg cm-' are in the vicinity of 24 h with an 800 W tube. These times may be reduced substantially by one or more of the following modifications:rotating anode or synchrotron radiation source, energy-dispersive diffractometry, and Bragg-Brentano diffractometry with a position-sensitive gas detector.Received

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Si(Li) semiconductor detector in angle and energy dispersive X-ray diffractometry

Cited by 15 publications

References 16 publications

Rietveld refinements on laboratory energy dispersive X-ray diffraction (EDXD) data

Rietveld refinements on laboratory energy dispersive X-ray diffraction (EDXD) data

Detectors and Detection Electronics

X‐ray diffractometry of airborne particulates deposited on membrane filters

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