2010
DOI: 10.1002/pssc.200900266
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Si and Si‐Ge wires for thermoelectrics

Abstract: In this paper thermal conductivity of boron‐doped Si and SiGe (3‐5 at.% of germanium) whiskers has been measured by means of slightly modified 3ω ‐method in the range of 290‐400 K. We have shown that obtained thermal conductivity temperature dependence of micron‐scale whiskers agrees well with expected for bulk Si and SiGe with 3 to 5% of Ge content and at room temperature is equal to 150 and 100 Wm‐1K‐1respectively, which evidences the reliability of proposed modification of 3ω ‐method. Prospects of possible … Show more

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Cited by 10 publications
(9 citation statements)
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“…4. The results obtained to raise their reliability should be checked using 3 method [14]. Nevertheless, the obtained values of the whisker thermal conductivity are in good accordance with literature data [15].…”
Section: An Analysis Of the Thermoelectric Parameters Of The Insb Whisupporting
confidence: 65%
“…4. The results obtained to raise their reliability should be checked using 3 method [14]. Nevertheless, the obtained values of the whisker thermal conductivity are in good accordance with literature data [15].…”
Section: An Analysis Of the Thermoelectric Parameters Of The Insb Whisupporting
confidence: 65%
“…sapphire). With this configuration the 3-method [11] was implemented to measure the temperature dependencies of thermal conductivity of whiskers, as in details described elsewhere [12]. Alternating electric current I0sin(t) of a certain frequency , passed through the whisker (electrodes 1 and 4, Fig.…”
Section: Measurements Methodologymentioning
confidence: 99%
“…One can neglect the heat flux in air in these conditions, because it does not exceed 1 % of the heat accumulated in the dielectric substrate. Adopting certain boundary conditions imposed by the limited sample sizes and geometric value of the current flowing through the sample, the solution of continuity equation can be written as follows [11,12]:…”
Section: Measurements Methodologymentioning
confidence: 99%
“…These silicon nanowire record values have not been outperformed since, not even in comparison with SiGe alloy nanowire data, for which best zT ∼ 0.46 at 450 K was reported . Due to a very challenging measurement technique, such fully characterized nanowires are still rare in literature, and much smaller zT values were reported in other references . As a consequence, these values are controversially discussed in the community.…”
Section: Silicon As a Thermoelectric Materialsmentioning
confidence: 99%