Shot Noise as a Probe of Spin-Polarized Transport through Single Atoms

Burtzlaff, Andreas; Weismann, Alexander; Brandbyge, Mads; Berndt, Richard

doi:10.1103/physrevlett.114.016602

Cited by 54 publications

(74 citation statements)

References 34 publications

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“…Current noise was measured with a setup described in Ref. 57. Briefly, after preparing a contact the STM con- Current noise density corrected for frequency response for bias currents of 0 (lowest spectrum), 202, and 283 nA.…”

Section: Noise Datamentioning

confidence: 99%

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Spin dependent transmission of nickelocene-Cu contacts probed with shot noise

et al. 2020

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The current I through nickelocene molecules and its noise are measured with a low temperature scanning tunneling microscope on a Cu(100) substrate. Density functional theory calculations and many-body modeling are used to analyze the data. During contact formation, two types of current evolution are observed, an abrupt jump to contact and a smooth transition. These data along with conductance spectra (dI/dV ) recorded deep in the contact range are interpreted in terms of a transition from a spin-1 to a spin-1 /2 state that is Kondo screened. Many-body calculations show that the smooth transition is also consistent with a renormalization of spin excitations of a spin-1 molecule by Kondo exchange coupling. The shot noise is significantly reduced compared to the Schottky value of 2eI but no influence of the Kondo effect or spin excitations are resolved. The noise can be described in the Landauer picture in terms of spin-polarized transmission of ≈ 35 % through two degenerate dπ-orbitals of the Nickelocene molecule.

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Section: Noise Datamentioning

confidence: 99%

“…We only used data from contacts whose conductance remained constant throughout the entire set of measurements (typi- Figure 9 shows the increase of the spectral noise power density with the bias current through the Nc junction. The excess noise ∆S was obtained using 57,58…”

Section: Fig 10mentioning

confidence: 99%

Spin dependent transmission of nickelocene-Cu contacts probed with shot noise

et al. 2020

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“…[1][2][3] Shot noise measurements at the mesoscale and nanoscale 4,5 reveal the fractional charge of quasiparticles in many-body systems, 6 contributions of different conduction channels to the electronic transport, 7-13 the crossover from ballistic to diffusive transport, 14 the valence orbital structure at the contact, 15,16 activation of vibrations in molecular conducting junctions, 10,[17][18][19] and the onset of spin-polarized transport. 20,21 Focusing on the white noise (flat power spectrum) component, we recall on the different noise sources: 1,2 The thermal motion of charge carriers in electronic conductors is responsible for the Johnson-Nyquist noise, 22,23 which is proportional to the temperature and the linear response electrical conductance. When a voltage bias is applied across a conductor, voltage-induced shot noise is activated, and it dominates over the thermal noise at high bias and low temperatures.…”

Section: Introductionmentioning

confidence: 99%

Origin of the Anomalous Electronic Shot Noise in Atomic-Scale Junctions

Shein-Lumbroso

Tal

et al. 2019

J. Phys. Chem. C

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Fluctuations pose fundamental limitations in making sensitive measurements, yet at the same time, noise unravels properties that are inaccessible at the level of the averaged signal. In electronic devices, shot noise arises from the discrete nature of charge carriers and it increases linearly with the applied voltage according to the celebrated Schottky formula. Nonetheless, measurements of shot noise in atomic-scale junctions at high voltage reveal significant nonlinear (anomalous) behavior, which varies from sample to sample, and has no specific trend. Here, we provide a viable, unifying explanation for these diverse observations based on the theory of quantum coherent transport.Our formula for the anomalous shot noise relies on-and allows us to resolve-two key characteristics of a conducting junction: The structure of the transmission function at the vicinity of the Fermi energy and the asymmetry of the bias voltage drop at the contacts. We tested our theory on high voltage shot noise measurements on Au atomic scale junctions and demonstrated a quantitative agreement, recovering both the enhancement and suppression of shot noise as observed in different junctions. The good theory-experiment correspondence supports our modelling and emphasizes that the asymmetry of the bias drop on the contacts is a key factor in nanoscale electronic transport, which may substantially impact electronic signals even in incomplex structures.

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“…This method may also find application in scanning tunneling microscopy experiments. [36] Further improvements are possible. By redesign of the amplifier circuit board a further reduction of the input capacitance by a factor of three should be possible.…”

Section: Discussionmentioning

confidence: 99%

Fast and accurate shot noise measurements on atomic-size junctions in the MHz regime

Tewari

Sabater

Kumar

et al. 2017

Review of Scientific Instruments

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Shot noise measurements on atomic and molecular junctions provide rich information about the quantum transport properties of the junctions and on the inelastic scattering events taking place in the process. Dissipation at the nanoscale, a problem of central interest in nano-electronics, can be studied in its most explicit and simplified form. Here, we describe a measurement technique that permits extending previous noise measurements to a much higher frequency range, and to much higher bias voltage range, while maintaining a high accuracy in noise and conductance. We also demonstrate the advantages of having access to the spectral information for diagnostics.

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Shot Noise as a Probe of Spin-Polarized Transport through Single Atoms

Cited by 54 publications

References 34 publications

Spin dependent transmission of nickelocene-Cu contacts probed with shot noise

Spin dependent transmission of nickelocene-Cu contacts probed with shot noise

Origin of the Anomalous Electronic Shot Noise in Atomic-Scale Junctions

Fast and accurate shot noise measurements on atomic-size junctions in the MHz regime

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