Short-range atomic order in the surface layer of sputter-deposited Al0.6W0.4 thin film investigated using directional elastic peak electron spectroscopy

Rok, Ł.; Mróz, S.; Zych, Eugeniusz; Janik‐Czachor, M.

doi:10.1016/j.jnoncrysol.2006.03.057

Journal of Non-Crystalline Solids

2006

DOI: 10.1016/j.jnoncrysol.2006.03.057

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Short-range atomic order in the surface layer of sputter-deposited Al0.6W0.4 thin film investigated using directional elastic peak electron spectroscopy

Ł. Rok

S. Mróz

Eugeniusz Zych

et al.

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Short-range atomic order in the surface layer of sputter-deposited Al0.6W0.4 thin film investigated using directional elastic peak electron spectroscopy

Cited by 2 publications

References 11 publications

Stereographic intensity projections of elastically backscattered electrons in directional elastic peak electron spectroscopy: Experiment and theory

Stereographic intensity projections of elastically backscattered electrons in directional elastic peak electron spectroscopy: Experiment and theory

Investigation of surface termination by directional elastic peak electron spectroscopy: Experiment and theory

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