2010
DOI: 10.1145/1735970.1736063
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Shoestring

Abstract: Aggressive technology scaling provides designers with an ever increasing budget of cheaper and faster transistors. Unfortunately, this trend is accompanied by a decline in individual device reliability as transistors become increasingly susceptible to soft errors. We are quickly approaching a new era where resilience to soft errors is no longer a luxury that can be reserved for just processors in high-reliability, mission-critical domains. Even processors used in mainstream computing will soon require protecti… Show more

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Cited by 55 publications
(20 citation statements)
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“…The introduced soft errors can corrupt the data of the program in execution. To counter this data corruption, a number of data flow error detection and recovery techniques have been proposed in literature [1,7,8,[12][13][14][15][16][17][19][20][21]. In previous work [4], we listed several data flow error detection techniques and discussed their reported results.…”
Section: Related Workmentioning
confidence: 99%
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“…The introduced soft errors can corrupt the data of the program in execution. To counter this data corruption, a number of data flow error detection and recovery techniques have been proposed in literature [1,7,8,[12][13][14][15][16][17][19][20][21]. In previous work [4], we listed several data flow error detection techniques and discussed their reported results.…”
Section: Related Workmentioning
confidence: 99%
“…A number of data flow error detection techniques have been developed based on a unique duplication mechanism for better fault coverage or lower overhead in terms of memory consumption. The duplication can be applied at various levels such as a full duplication and selective duplication [1,4,7,8,[12][13][14][15]17,18]. Full duplication techniques and selective code duplication techniques are discussed in Sections 2.1 and 2.2 respectively.…”
Section: Data Flow Error Detectionmentioning
confidence: 99%
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