Shock launching in silicon studied with use of pulsed x-ray diffraction

Nanosecond white-light Laue diffraction measurements of dislocation microstructure in shock-compressed single-crystal copper

“…Given that the fundamental understanding sought is of the physics that is occurring at the lattice level, the development of techniques of X-ray diffraction on nanosecond and sub-nanosecond timescales, with the X-ray pulse synchronized to the shock, appears a promising approach for such investigations. Indeed, such time-resolved X-ray diffraction (TXRD) methods have been used extensively to study shock phenomena for several decades [12][13][14][15][16][17][18][19][20] , with several notable successes, including the direct observation of the a À e transition in shock-compressed iron 6,21 . Some progress in understanding rapid shock-induced plasticity has been made: diffraction of monochromatic X-rays from planes parallel and perpendicular to the shock propagation direction has directly detected elastic strain in both directions (which gives a measure of plastic strain, as the total strain (elastic plus plastic) perpendicular to the shock propagation direction in a uniaxially strained material is zero) 16,[22][23][24][25] .…”

Reconstructing longitudinal strain pulses using time-resolved x-ray diffraction

“…With the development of high-brightness, short pulse, hard x-ray sources in the last 25 years, TRXRD has rapidly grown to study a whole range of laser initiated structural dynamics 1,3,5,11,12,[16][17][18][19][20][21][22][23] . Like traditional optical pump-probe techniques, TRXRD typically utilizes an intense optical pump pulse to rapidly initiate structural change through the rapid heating of the material.…”

“…The central wavelength of this strain pulse can be as small as a few nanometers, providing a method to directly image of nanometer scale structures and biomaterials 7,8 . Direct comparisons of theoretical models with experiments can lead to an understanding of electron-phonon interactions and thermal properties of materials 1,[9][10][11][12][13][14][15][16] .…”

Femtosecond X-Ray Diffraction Studies of the Reversal of the Microstructural Effects of Plastic Deformation during Shock Release of Tantalum

“…Here we use XRD to directly monitor lattice orientations during shock release. The technique of in situ XRD to study shock-compressed materi-als has been developed over several years utilizing a number of different shock drivers and x-ray sources, including diodes [24][25][26][27], laser-produced-plasmas [28][29][30][31][32][33] and 3 rd generation synchrotrons [34][35][36][37]. More recently, with the advent of 4 th generation light sources such as the Linac Coherent Light Source (LCLS) single-shot 100-fs diffraction patterns can be obtained from laser-shocked crystals, providing lattice-level information on a timescale shorter than even the fastest phonon period [38][39][40][41][42][43].…”