2017
DOI: 10.1016/j.mechmat.2017.02.008
|View full text |Cite
|
Sign up to set email alerts
|

Sharp volumetric billboard based characterization and modeling of complex 3D Ni/Al high energy ball milled composites

Abstract: We present an innovative image-based modeling technique, based on Google Earth like algorithms, to effectively resolve intricate material morphology and address the computational complexity associated with heterogeneous materials. This sharp volumetric billboard algorithm stems from a volumetric billboard method, a multi-resolution modeling strategy in computer graphics. In this work, we enhance volumetric billboards through a sharpening filter to reconstruct the statistical information of heterogeneous system… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
1
0

Year Published

2019
2019
2024
2024

Publication Types

Select...
4
1

Relationship

1
4

Authors

Journals

citations
Cited by 8 publications
(1 citation statement)
references
References 70 publications
(104 reference statements)
0
1
0
Order By: Relevance
“…H. Lee et al (2011) and Gillman and Matouš (2014) used microtomographic data to compute mechanical and thermal properties of particulate systems. Yushu et al (2017) used sharp volumetric billboards (SVB) to study complex 3D Ni/Al high energy ball-milled composites. Gillman et al (2017) developed microstructure statistics-property relations of silver paste interconnects using the combination of focused ion beam (FIB) milling and scanning electron microscopy (SEM) imaging.…”
mentioning
confidence: 99%
“…H. Lee et al (2011) and Gillman and Matouš (2014) used microtomographic data to compute mechanical and thermal properties of particulate systems. Yushu et al (2017) used sharp volumetric billboards (SVB) to study complex 3D Ni/Al high energy ball-milled composites. Gillman et al (2017) developed microstructure statistics-property relations of silver paste interconnects using the combination of focused ion beam (FIB) milling and scanning electron microscopy (SEM) imaging.…”
mentioning
confidence: 99%