2016
DOI: 10.1021/acs.nanolett.6b02802
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Sharp-Tip Silver Nanowires Mounted on Cantilevers for High-Aspect-Ratio High-Resolution Imaging

Abstract: Despite many efforts to fabricate high-aspectratio atomic force microscopy (HAR-AFM) probes for highfidelity, high-resolution topographical imaging of three-dimensional (3D) nanostructured surfaces, current HAR probes still suffer from unsatisfactory performance, low wear-resistivity, and extravagant prices. The primary objective of this work is to demonstrate a novel design of a high-resolution (HR) HAR AFM probe, which is fabricated through a reliable, costefficient benchtop process to precisely implant a si… Show more

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Cited by 30 publications
(36 citation statements)
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“…The shape, size and composition of such particles can be readily controlled with high homogeneity and on a large scale, making them ideal for plasmonic applications. 33 Additionally, they help to limit tipdegradation 34,35 as they exhibit superior mechanical properties compared to the corresponding bulk material. For example, the Young's modulus of silver nanowires can reach up to 160 GPa, 36 around 3 times greater than found in bulk.…”
Section: Introductionmentioning
confidence: 99%
“…The shape, size and composition of such particles can be readily controlled with high homogeneity and on a large scale, making them ideal for plasmonic applications. 33 Additionally, they help to limit tipdegradation 34,35 as they exhibit superior mechanical properties compared to the corresponding bulk material. For example, the Young's modulus of silver nanowires can reach up to 160 GPa, 36 around 3 times greater than found in bulk.…”
Section: Introductionmentioning
confidence: 99%
“…The radiuses of those tips typically range from several nanometers to tens of nanometers, accumulating a large density of charges, resulting in a greatly enhanced EM field near to those tips with small volume. Scanning probe microscopes, such as atomic force microscope (AFM), and scanning tunneling microscope, are always used to provide the feedback to bring the sharp tips in contact with the samples [23,131,132]. The EM fields can be further enhanced by several orders in the gap modes formed between tips and metal substrates.…”
Section: Other Structuresmentioning
confidence: 99%
“…This scheme substantially reduces the hydrodynamic damping of dynamic AFM by reducing contact cross-section with the liquid environment. In order to acquire a high-resolution topography image, it is essential to utilize a sharp and high aspect ratio AFM tip (Ma et al, 2016). The TR-AFM can oscillate in all three directions which involve a coupled bending-torsional motion of cantilever and bending of nanoneedle in two directions.…”
mentioning
confidence: 99%