“…[6] The extrinsic environmental condition, i.e., light intensity, electric field, and temperature during device operation can promote the natal local defects towards the degradation of the active layer, thus it is paramount to extract the untrapped and detrapped carriers promptly to militate charge accumulation and recombination. [6,9,10] The apparent J-V hysteresis and poor stability originate not only from the defective active layer and disordered charge transport, but also from perovskite/charge transport layer (CTL) interfaces, and charge extracting materials. [4,11,12] The interface between the hole transport material (HTM) and the perovskite remains the vulnerable part in the device for stability as trapped charges at the interface between perovskite and charge extraction layer are responsible for the irreversible degradation caused by moisture.…”