2013
DOI: 10.1088/1748-0221/8/02/c02026
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SEU tolerant memory design for the ATLAS pixel readout chip

Abstract: The FE-I4 chip for the B-layer upgrade is designed in a 130 nm CMOS process. For this design, configuration memories are based on the DICE latches where layout considerations are followed to improve the tolerance to SEU. Tests have shown that DICE latches for which layout approaches are adopted are 30 times more tolerant to SEU than the standard DICE latches. To prepare for the new pixel readout chip planned for the future upgrades, a prototype chip containing 512 pixels has been designed in a 65 nm CMOS proce… Show more

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Cited by 6 publications
(11 citation statements)
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“…The IBL data output is a serial Low Voltage Differential Signal (LVDS), 8b/10b encoded at a rate of 160 MBit/s. The chip has many configurable settings that are stored in triple-redundant registers providing the required radiation hardness to single event upsets (SEU) [35].…”
Section: The Fe-i4 Front-end Chipmentioning
confidence: 99%
See 3 more Smart Citations
“…The IBL data output is a serial Low Voltage Differential Signal (LVDS), 8b/10b encoded at a rate of 160 MBit/s. The chip has many configurable settings that are stored in triple-redundant registers providing the required radiation hardness to single event upsets (SEU) [35].…”
Section: The Fe-i4 Front-end Chipmentioning
confidence: 99%
“…An FPGA running a MicroBlaze processor on each of the ROD and BOC cards handles the Ethernet connection between them. The BOC card is interfaced to the detector and to the ATLAS read-out system: the detector interface uses commercial SNAP12 optical transmitters and receivers 34 ; the read-out interface is via S-LINK connections 35 .…”
Section: Off-detector Read-out Electronics (Rod/boc)mentioning
confidence: 99%
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“…Such interactions are di cult to model, but an understanding of SEU rates is essential for detector operations. This Section presents an in-situ measurement of the probability of bit flips in the radiation hard memory cells known as Dual Interlocked CElls, or DICE latches [171] [172], which store the configuration of each pixel in the IBL.…”
Section: C1 Single Event Upsetmentioning
confidence: 99%