Sequential x-ray diffraction topography at 1-BM x-ray optics testing beamline at the advanced photon source

Stoupin, Stanislav; Shvyd’ko, Yuri; Trakhtenberg, E.; Liu, Zunping; Lang, Keenan; Huang, Xianrong; Wieczorek, Michael; Kasman, Elina; Hammonds, J. P.; Macrander, Albert T.; Assoufid, Lahsen

doi:10.1063/1.4952940

Cited by 20 publications

(14 citation statements)

References 11 publications

(15 reference statements)

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“…A double-crystal setup with a Bragg/Bragg+À setting was used in which the first crystal was a highly asymmetric Si (331) beam expander and the second crystal, the silicon carbide wafer, was diffracting withg ¼ 0008 ð Þ in reflection geometry. 11 A schematic of the diffraction geometry is shown in Fig. 2a.…”

Section: Methodsmentioning

confidence: 99%

Mapping of Lattice Strain in 4H-SiC Crystals by Synchrotron Double-Crystal X-ray Topography

Guo

Yang

Raghothamachar

et al. 2017

Journal of Elec Materi

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The presence of lattice strain in n-doped 4H-SiC substrate crystals grown by a physical vapor transport method can strongly influence the performance of related power devices that are fabricated on them. Information on the level and the variation of lattice strain in these wafer crystals is thus important. In this study, a non-destructive method is developed based on synchrotron double-crystal x-ray topography to map lattice strains in 4H-SiC wafers. Measurements are made on two 4H-SiC substrate crystals-one is an unprocessed commercial wafer while the other was subject to a post-growth high-temperature heat treatment. Maps of different strain components are generated from the equi-misorientation contour maps recorded using synchrotron monochromatic radiation. The technique is demonstrated to be a powerful tool in estimating strain fields in 4H-SiC crystals. Analysis of the strain maps also shows that the normal strain components vary much more significantly than do the shear/rotation components, indicating that lattice dilation/compression rather than lattice tilt is the major type of deformation caused by both the incorporation of nitrogen dopants and the nucleation of basal plane dislocations.

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Section: Methodsmentioning

confidence: 99%

Mapping of Lattice Strain in 4H-SiC Crystals by Synchrotron Double-Crystal X-ray Topography

Guo

Yang

Raghothamachar

et al. 2017

Journal of Elec Materi

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“…Rocking curve imaging of the CVD diamond crystal plates aligned for either 111, 220 or 400 Laue reflections was performed in the double-crystal nearly-nondispersive configurations shown in Figure 1. The experiments were conducted at 1-BM Optics beamline using the sequential X-ray topography setup [12]. The bending magnet synchrotron radiation is monochromatized using a Si 111 double-crystal monochromator (DCM).…”

Section: Methodsmentioning

confidence: 99%

Selection of CVD Diamond Crystals for X-ray Monochromator Applications Using X-ray Diffraction Imaging

et al. 2019

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A set of 20 single crystal diamond plates synthesized using chemical vapor deposition (CVD) was studied using X-ray diffraction imaging to determine their applicability as side-bounce (single-reflection) Laue monochromators for synchrotron radiation. The crystal plates were of optical grade (as provided by the supplier) with (001) nominal surface orientation. High dislocation density was found for all samples. Distortions in the crystal lattice were quantified for low-index Laue reflections of interests using rocking curve topography. Maps of effective radius of curvature in the scattering plane were calculated using spline interpolation of the rocking curve peak position across the studied plates. For several selected plates, nearly flat regions with large effective radius of curvature were found ( R 0 ≳ 30 - 70 m, some regions as large as 1 × 4 mm 2 ). The average width of the rocking curve for these regions was found to be about 150 μ rad (r.m.s.). These observations suggest that the selected CVD diamond plates could be used as intermediate-bandwidth monochromators refocusing the radiation source to a specific location downstream with close to 1:1 distance ratio.

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“…In this technique, Bragg reflection images of a crystal under study are measured with a pixel x-ray detector, with images being taken sequentially at different incidence angles to the reflecting atomic planes of the wellcollimated x-rays; Bragg reflection maps are calculated for the reflection peak intensities, angular widths and angular positions. We used an RCI setup [42,44] at xray optics testing beamline 1BM [45] at the Advanced Photon Source (APS), schematically shown in Fig. 8.…”

Section: Manufacturingmentioning

confidence: 99%

Diamond Channel-Cut Crystals for High-Heat-Load, Beam-Multiplexing, Narrow-Band X-ray Monochromators

Shvyd'ko,

Terentyev,

Blank

et al. 2021

Preprint

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Next-generation, high-brilliance x-ray photon sources call for new x-ray optics. Here we demonstrate the feasibility of using monolithic diamond channel-cut crystals as high-heat-load, beammultiplexing, narrow-band, mechanically-stable x-ray monochromators with high-power x-ray beams at cutting-edge, high-repetition-rate x-ray free-electron laser (XFEL) facilities. The diamond channel-cut crystals fabricated and characterized in these studies are designed as two-bounce Bragg reflection monochromators directing 14.4-keV or 12.4-keV x-rays within a 15-meV-bandwidth to 57 Fe or 45 Sc nuclear resonant scattering experiments, respectively. The crystal design allows out-ofband x-rays within a 1-eV XFEL bandwidth to be transmitted with minimal losses to alternative simultaneous experiments. Only 2% of the incident 100-W x-ray beam is absorbed in a 50µm-thick first diamond crystal reflector, ensuring that the monochromator crystal is highly stable. Other x-ray optics applications of diamond channel-cut crystals are anticipated.

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Sequential x-ray diffraction topography at 1-BM x-ray optics testing beamline at the advanced photon source

Cited by 20 publications

References 11 publications

Mapping of Lattice Strain in 4H-SiC Crystals by Synchrotron Double-Crystal X-ray Topography

Mapping of Lattice Strain in 4H-SiC Crystals by Synchrotron Double-Crystal X-ray Topography

Selection of CVD Diamond Crystals for X-ray Monochromator Applications Using X-ray Diffraction Imaging

Diamond Channel-Cut Crystals for High-Heat-Load, Beam-Multiplexing, Narrow-Band X-ray Monochromators

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