2018
DOI: 10.1002/solr.201800027
|View full text |Cite
|
Sign up to set email alerts
|

Sequential Processing: Spontaneous Improvements in Film Quality and Interfacial Engineering for Efficient Perovskite Solar Cells

Abstract: Planar perovskite solar cells (PSCs) represent a promising alternative to solar cells due to their many advantages. To improve device performance, it is necessary to develop PSCs with good interfacial engineering and film crystallinity, which are two critical aspects of high‐performance PSCs. However, both aspects are relatively independent and difficult to simultaneously enhance. This study reports an effective and universal sequential solution deposition process to specifically address this issue. When the t… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
19
0

Year Published

2018
2018
2022
2022

Publication Types

Select...
7

Relationship

3
4

Authors

Journals

citations
Cited by 33 publications
(19 citation statements)
references
References 64 publications
0
19
0
Order By: Relevance
“…Theoretical Modeling : Maxwell's equations were rigorously solved by 3D finite‐difference method . The dielectric constant of MoO 3 with hydrogen reduction was measured by ellipsometry and MoS 2 is adapted from ref.…”
Section: Methodsmentioning
confidence: 99%
“…Theoretical Modeling : Maxwell's equations were rigorously solved by 3D finite‐difference method . The dielectric constant of MoO 3 with hydrogen reduction was measured by ellipsometry and MoS 2 is adapted from ref.…”
Section: Methodsmentioning
confidence: 99%
“…The charge‐transfer dynamics of the devices were investigated by electrochemical impedance spectroscopy (EIS). The resistance of the devices was calculated by fitting the respective EIS curves . In general, R s represents the transfer resistance of the device which is the point of intersection of EIS and abscissa.…”
Section: Resultsmentioning
confidence: 99%
“…To further investigate the effect of modified SnO 2 layers on perovskite film defects, we test J SC and V OC at a different light intensity and fit them according to the following formula: [48] J I ∝ α…”
Section: Wwwadvmatinterfacesdementioning
confidence: 99%