“…4(a) that when pure a-Si:H n-layer is used, QE measured in dark condition (without bias light) follows the response of the sub-cell with the lowest current at each wavelength, showing nearly a triangular shape, when µc-Si:H n-layer is used, a departure of lowest spectral response in the long wavelength range (> 600 nm) is observed, while in the short wavelength it is in accord with the response of the bottom cell. As discussed by Loffler [18] and Rubinelli, [21] this indicates that there is apparent current leakage of the top cell because of an inefficiency blocking the current generated in bottom cell by the top cell. Implementing a thin n-a-Si:H layer between the a-Si:H i-layer and µc-Si:H n-layer, decreasing the thickness of the µc-Si:H n-layer at the same time, we find that the current leakage effect becomes smaller (Figs.…”
“…4(a) that when pure a-Si:H n-layer is used, QE measured in dark condition (without bias light) follows the response of the sub-cell with the lowest current at each wavelength, showing nearly a triangular shape, when µc-Si:H n-layer is used, a departure of lowest spectral response in the long wavelength range (> 600 nm) is observed, while in the short wavelength it is in accord with the response of the bottom cell. As discussed by Loffler [18] and Rubinelli, [21] this indicates that there is apparent current leakage of the top cell because of an inefficiency blocking the current generated in bottom cell by the top cell. Implementing a thin n-a-Si:H layer between the a-Si:H i-layer and µc-Si:H n-layer, decreasing the thickness of the µc-Si:H n-layer at the same time, we find that the current leakage effect becomes smaller (Figs.…”
“…5b support this observation. There is a decrease in the EQE in the entire spectral range, which indicates that carrier recombination is occurring mainly at the defective p/i interface [42], [43].…”
“…The low V oc in our cells might be due to the leakage paths to increase the dark current of the top cell. 12,13 If the leakage paths in top cell can be eliminated and the optimized tunneling recombination junction (TRJ) layer is adopted, higher V oc can be obtained. 14,15 The initial efficiency of the single-junction a-Si cells used in this work was around 9.8% with a V oc of 0.91 V, a J sc of 14.7 mA/cm 2 , and a FF of 74%.…”
The recovery of light-induced degradation of the tandem micromorph solar cell by applying reverse bias is compared with the single-junction amorphous silicon solar cell. The illuminated current density-voltage characteristics and external quantum efficiency show that the degradation of both the micromorph and the amorphous silicon cells can be recovered by applying sufficient reverse bias. The micromorph cell was recovered at smaller reverse bias than amorphous silicon cell. The abundant H in the microcrystalline silicon bottom cell of the micromorph cell can act as a reservoir to repair the defects in the amorphous silicon top cell at the reverse bias. This is responsible for small recovery bias of tandem cells.
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