2001
DOI: 10.1109/77.979855
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Sensitivity of R/sub s/-measurement of HTS thin films by three prime resonant techniques: cavity resonator, dielectric resonator, and microstrip resonator

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Cited by 8 publications
(4 citation statements)
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“…In (1), p is the fitting parameter whose value has been varied from 1 to 4 to obtain the best fit of R s and X s with the experimentally observed results. The surface resistance R s and surface reactance X s are inferred from the measured changes in the unloaded Q-value, 3 db bandwidth, insertion loss, and resonant frequency with temperature (Kedar et al, 2002;Misra et al, 2001). The value of p as 1.65 gives the best fit.…”
Section: Surface Impedance Of Hts Stripmentioning
confidence: 99%
“…In (1), p is the fitting parameter whose value has been varied from 1 to 4 to obtain the best fit of R s and X s with the experimentally observed results. The surface resistance R s and surface reactance X s are inferred from the measured changes in the unloaded Q-value, 3 db bandwidth, insertion loss, and resonant frequency with temperature (Kedar et al, 2002;Misra et al, 2001). The value of p as 1.65 gives the best fit.…”
Section: Surface Impedance Of Hts Stripmentioning
confidence: 99%
“…Ag-doped laser-ablated YBa 2 Cu 3 O 7−x thin film of thickness 400 nm has been deposited on a 10 mm × 10 mm × 0.5 mm thick LaAlO 3 (ε r = 24.5) substrate having a dc transition temperature, T c , of 89 K. The surface resistance of the unpatterned film has been measured through the cavity resonator technique using a sapphire-loaded TE 011 mode dielectric resonator [14], yielding a value of 0.8 m at 77 K and 10 GHz. Further, the patterning of the film has been done using conventional photolithography techniques followed by chemical etching, to fabricate a half-wavelength microstrip resonator providing fundamental resonance at 5 GHz with a thermally evaporated copper ground plane.…”
Section: Sample Preparationmentioning
confidence: 99%
“…While the ultimate sensitivity is obtained with superconducting cavities [14], this method is definitely not feasible when the sample has to be characterized under a dc magnetic field. In this case, metallic cavities [15] or dielectric resonators in low-indices [16,17,18,19] as well as in whispering gallery modes [20,21,22,23] can be used. Dielectric resonators exhibit increased sensitivity, and more compact dimensions.…”
Section: Introductionmentioning
confidence: 99%