Sensitivity-based investigation of threshold voltage variability in 32-nm flash memory cells

Bonfiglio, Valentina; Iannaccone, Giuseppe

doi:10.1109/essderc.2012.6343347

2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) 2012

DOI: 10.1109/essderc.2012.6343347

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Sensitivity-based investigation of threshold voltage variability in 32-nm flash memory cells

Valentina Bonfiglio

Giuseppe Iannaccone

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Sensitivity-based investigation of threshold voltage variability in 32-nm flash memory cells

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References 9 publications

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