Tenth International Conference on Computational Electromagnetics (CEM 2019) 2019
DOI: 10.1049/cp.2019.0114
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Sensitivity Analysis for Robust Performance of Electrical Machines Affected by Manufacturing Tolerance

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“…This terminology is usually divided into two parts: classical and modern methodologies [37]. These strategies are similar to the Taguchi proposed orthogonal arrays [36,[47][48][49]. The main difference is that random error exists in a laboratory experiment but does not exist in a computer experiment [37,50].…”
Section: Design Of Experiments For Tolerance Analysismentioning
confidence: 99%
“…This terminology is usually divided into two parts: classical and modern methodologies [37]. These strategies are similar to the Taguchi proposed orthogonal arrays [36,[47][48][49]. The main difference is that random error exists in a laboratory experiment but does not exist in a computer experiment [37,50].…”
Section: Design Of Experiments For Tolerance Analysismentioning
confidence: 99%